In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods
of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its
high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system
developed by the authors at University College London, as well as the results of surface measurements using this
methodology on thin sheets of actuated glass.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.