Toshihiro Fukai
at Saitama Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 August 2015 Paper
Proceedings Volume 9660, 966010 (2015) https://doi.org/10.1117/12.2196861
KEYWORDS: Particles, Multilayers, Speckle, Optical coherence tomography, Interfaces, Glasses, Scattering, Image processing, Signal processing, Resistance

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