Dr. Victor J. Orphan
Senior Vice President for Corp. Development at Science Applications International Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 February 1997 Paper
Victor Verbinski, Victor Orphan
Proceedings Volume 2867, (1997) https://doi.org/10.1117/12.267908
KEYWORDS: Inspection, Sensors, Gamma radiation, Signal processing, Image processing, Radiography, Collimators, Scanners, Telecommunications, Signal detection

Proceedings Article | 6 February 1997 Paper
Victor Verbinski, Victor Orphan, Siraj Khan
Proceedings Volume 2936, (1997) https://doi.org/10.1117/12.266261
KEYWORDS: Inspection, Sensors, Radiography, Gamma radiation, Scanners, Velocity measurements, Detector development, Fourier transforms, Reliability, Data communications

Proceedings Volume Editor (1)

SPIE Conference Volume | 16 December 1993

Conference Committee Involvement (3)
Non-Intrusive Inspection Technologies
17 April 2006 | Orlando (Kissimmee), Florida, United States
Hard X-Ray and Gamma-Ray Detector Physics V
4 August 2003 | San Diego, California, United States
X-Ray Detector Physics and Applications II
13 July 1993 | San Diego, CA, United States
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