Dr. Victoria H. DiStefano
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 September 2020 Presentation + Paper
J. LaManna, D. Hussey, V. DiStefano, E. Baltic, D. Jacobson
Proceedings Volume 11494, 114940P (2020) https://doi.org/10.1117/12.2569666
KEYWORDS: X-rays, Tomography, Excel, Solids, CMOS sensors, Nondestructive evaluation, Materials science, Hydrogen, Microfluidics, Water

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