Dr. Wayne Robert Tompkin
Head Optical Technology at OVD Kinegram Corp
SPIE Involvement:
Author
Publications (16)

Proceedings Article | 9 February 2006 Paper
Proceedings Volume 6075, 607514 (2006) https://doi.org/10.1117/12.644682
KEYWORDS: Stanford Linear Collider, Computer security, Biometrics, Reliability, Resistance, Homeland security, Inspection, Laser processing, Computer programming, Corrosion

Proceedings Article | 9 February 2006 Paper
Andreas Schilling, Wayne Tompkin, René Staub, Roger Hersch, Sylvain Chosson, Isaac Amidror
Proceedings Volume 6075, 60750V (2006) https://doi.org/10.1117/12.642910
KEYWORDS: Visualization, Information security, Microlens array, Microlens, Brain-machine interfaces, Moire patterns, Halftones, Opacity, Eye, Photography

Proceedings Article | 3 June 2004 Paper
Proceedings Volume 5310, (2004) https://doi.org/10.1117/12.527686
KEYWORDS: Polarizers, Information security, Moire patterns, Photography, Dielectric polarization, Eye, Binary data, Glasses, Visualization, Raster graphics

Proceedings Article | 3 June 2004 Paper
Proceedings Volume 5310, (2004) https://doi.org/10.1117/12.527571
KEYWORDS: Diffraction gratings, Coating, Diffraction, Thin films, Reflection, Reflectivity, Fluctuations and noise, Light sources and illumination, Visualization, Thin film coatings

Proceedings Article | 19 April 2002 Paper
Proceedings Volume 4677, (2002) https://doi.org/10.1117/12.462715
KEYWORDS: Scattering, Diffraction gratings, Solids, Visualization, Diffraction, Scatter measurement, Visible radiation, Specular reflections, Visual optics, Light

Showing 5 of 16 publications
Conference Committee Involvement (2)
Optical Security and Counterfeit Deterrence Techniques VI
18 January 2006 | San Jose, California, United States
Optical Security and Counterfeit Deterrence Techniques V
20 January 2004 | San Jose, California, United States
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