Wei-Yuan Hsiao
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 August 2010 Paper
Proceedings Volume 7786, 77860N (2010) https://doi.org/10.1117/12.860472
KEYWORDS: Reflectivity, Niobium, Dielectrics, Thin films, Silica, Antireflective coatings, Organic light emitting diodes, Aluminum, Reflection, Refractive index

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