Light control-light characteristics of a micro fiber (MF) coated with tungsten disulfide (WS2) nanosheets is demonstrated in this paper. A device with WS2-coated MF has been fabricated, and the transmitted optical powers of the device are measured with 405 and 660 nm pump lasers. By tuning the pump lasers, we achieve the all light controllable sensing of WS2-coated MF over a broadband wavelength range from 1520 to 1620 nm, offering competitive sensities of 0.238 and 0.136 dB/mW for 405 and 660 nm pump lasers, respectively. In addition, The rise and fall times of the transient response to pump lasers are also measured. For the 405 nm laser, the rise and fall times of the transient response are 0.32s and 0.42s, respectively. For 660 nm laser, the response times toward the presence (removal) of the pump light transient response are 0.28s and 0.37s, respectively. Experimental results indicate that the device integrated with WS2 could hold promising potentials in photoelectric and photonic applications.
We propose the electro-optic mode deflection devices based on annealed proton exchange (APE) waveguides in lithium niobate with microstructured electrodes. Two mode deflection devices with right-triangle-shaped electrodes (Device A) and isosceles-triangle-shaped electrodes (Device B) are investigated. Taking advantage of the refractive index prism array formed when applying an external voltage to the electrodes, the mode can be deflected. Beam smoothing can be achieved by applying alternating voltages. A∼1.28 μm beam deflection is obtained by applying a voltage (20 V) for Device A. For Device B, a 3.52 μm beam deflection is obtained by applying a -15 V voltage to the electrodes. Device B has a horn-shaped input waveguide which ensures that the output is a quasi-single mode. The mode quality of the deflection beam is also quantified by the CMOS camera. Smoothing the non-uniform density distribution of light beam is confirmed by averaging over 69 images taken by the CMOS camera with alternating voltage. These electro-optic mode deflection devices have potential applications in electro-optic sampling, high-speed optical switch, and beam smoothing of a high-power laser.
Optical fibers have long been the backbone of modern communication system. One way of extending the capability of optical fibers is to thin down the core sizes as microfiber which facilitates light-matter interaction through evanescent light. Among different microfiber based structure, the microfiber knot resonator (MKR) is a resonant structure which finds applications in lasing, filtering and optical switching [1-2]. Particularly, when the MKR structure is combined with functional two-dimensional materials, a large panel of devices can be achieved via the investigation of variations in resonance properties.
Here, a layered metal dichalcogenide semiconductor tin disulfide (SnS2), characterized with high intrinsic electron mobility and strong absorption in the visible light regime [3], is chosen to be coated onto MKR. The all-optical control of light functionality is demonstrated in MKR with SnS2 structure where the signal light power is controlled by the external violet pump power via the absorption property of SnS2. The device fabrication, characterization and obtained experimental results will be presented in the talk.
We present easy-to-implement technologies to produce LiNbO3 PhCs in confined optical waveguides. Ti-indiffusion or
Annealed Proton Exchange (APE) are combined with optical grade dicing to fabricate ridge waveguides with
propagation losses that can be lower than 0.2 dB/cm. Firstly we show how a PhC inscribed in a confined ridge
waveguide can be exploited as a temperature sensor with an unexpectedly high 8 nm/°C temperature sensitivity. LiNbO3
PhCs with high aspect ratio are also demonstrated. The performance is achieved by properly tilting the ridge before
patterning its walls by Focused Ion Beam (FIB). A eight micrometer long 1D-PhC on a Ti:LiNbO3 ridge waveguide has
been fabricated and its reflectivity has been evaluated using an optical coherence tomography (OCT) system: it is
measured to be 53 % for the TM wave and 47 % for the TE wave. The period can be optimized in order to increase the
reflection of the 1D-PhC up to 80 %. These developments open the way to the dense integration of compact dynamic
devices such as modulators, spectral filters or electric field sensors.
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