Willem van de Groep
at Thales Cryogenics BV
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 31 May 2012 Paper
W. van de Groep, H. van der Weijden, R. van Leeuwen, T. Benschop, J. Cauquil, R. Griot
Proceedings Volume 8353, 83531S (2012) https://doi.org/10.1117/12.918245
KEYWORDS: Reliability, Failure analysis, Sensors, Cryogenics, Manufacturing, Accelerated life testing, Staring arrays, Line edge roughness, Ear, Image quality

Proceedings Article | 21 May 2011 Paper
Proceedings Volume 8012, 80122N (2011) https://doi.org/10.1117/12.886354
KEYWORDS: Diagnostics, Data storage, Cryogenics, Digital signal processing, Sensors, Electronics, Data communications, Cameras, Linear filtering, Diagnostic tests

Proceedings Article | 3 November 2010 Paper
A. Benschop, W. van de Groep, J. Mullié, D. Willems, O. Clesca, R. Griot, J.-Y. Martin
Proceedings Volume 7834, 783407 (2010) https://doi.org/10.1117/12.865135
KEYWORDS: Cryogenics, Reliability, Coating, Cryocoolers, Electronics, Space operations, Remote sensing, Manufacturing, Tolerancing, Photography

Proceedings Article | 4 May 2010 Paper
H. van der Weijden, A. Benschop, W. v. d. Groep, D. Willems, J. Mullie
Proceedings Volume 7660, 76602O (2010) https://doi.org/10.1117/12.848532
KEYWORDS: Cryogenics, Cryocoolers, Digital signal processing, Reliability, Computer aided design, Electronics, Signal processing, Failure analysis, Diodes, Cameras

Proceedings Article | 7 May 2009 Paper
D. Willems, T. Benschop, W. v. d. Groep, J. Mullié, H. v. d. Weijden, M. Tops
Proceedings Volume 7298, 729815 (2009) https://doi.org/10.1117/12.818737
KEYWORDS: Electronics, Digital signal processing, Sensors, Cryogenics, Cryocoolers, Temperature metrology, Power supplies, Cooling systems, Diagnostics, Reliability

Showing 5 of 7 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top