Yaling Zhou
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 February 2007 Paper
Proceedings Volume 6470, 64700V (2007) https://doi.org/10.1117/12.701429
KEYWORDS: Thin films, Polymethylmethacrylate, Dye lasers, Silicon, Nd:YAG lasers, Energy efficiency, Laser damage threshold, Solid state lasers, Semiconducting wafers, Laser energy

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