Yannick Poujet
PhD Student at Univ de Franche-Comté
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 April 2006 Paper
Yannick Poujet, Jérôme Salvi, Roland Salut, Fadi Baida, Daniel Van Labeke, Alexandre Perentes, Christian Santschi, Patrick Hoffmann
Proceedings Volume 6195, 61951M (2006) https://doi.org/10.1117/12.662896
KEYWORDS: Silver, Near field optics, Finite-difference time-domain method, Silicon, Near field, Near field scanning optical microscopy, Solids, Scanning electron microscopy, Current controlled current source, Nanolithography

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