Yao Shuai
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 August 2009 Paper
Y. Shuai, C. Wu, W. Zhang, Y. Li, X. Liu, J. Zhu
Proceedings Volume 7383, 73830H (2009) https://doi.org/10.1117/12.834985
KEYWORDS: Etching, Silicon, Infrared detectors, Thin films, Silicon films, Anisotropic etching, Sensors, Surface roughness, Chemical elements, Scanning electron microscopy

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