Mr. Zhihao Zhu Profile

Zhihao Zhu

at Beijing Institute of Space Mechanics & Electricity

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Proceedings Article | 12 March 2021 Paper

Experimental study of temperature characteristics in a low-light-level CMOS system

Yun Wang, Qiang Mei, Hao Cai, Dong Wang, Yongli Hu, Zhihao Zhu

Proceedings Volume 11763, 117639F (2021) https://doi.org/10.1117/12.2587704

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The low-light-level sensing technology has been subject to the development of image sensors. The later, developed in the recent decades, has been improved from the low light level image intensifier, EBCCD, to recently, the CMOS technology. New technologies, for instance, APS(Active Pixel Sensor), back illuminated, etc. have been supplied following the CMOS process technology, resulting in a series of CMOS detectors with high sensitivity, lower noise and fewer operation restrictions. However, as a weak signal detection system, the operation condition, for example, the temperature characteristics related with the exposure time, ambient brightness, and target brightness, also cannot be ignored. In this paper, we presented a detailed temperature characteristic analysis based on a low-light-level CMOS system. The dark current was verified based on all black tests. The calculation as followed was drawn based on the varying ambient conditions and settings of the system:1, A typical dark current curve was obtained from the experiment, double every 9℃ with environment temperature increased.2, the information acquisition ability is affected by the exposure time, ambient brightness, and target brightness, reflected by the dark current and photon noise. Meanwhile, it was proofed in this paper, in a low light level system, the traditional signal to noise ratio calculation could not delaminate the brightness caused by the dominate photo noise, resulting an error strong enough to affect signal. Therefore, in this paper, a SNR evaluate method which could improve the objectivity of the evaluation of the low light level image was provided. It was believed to be helpful to the future research.

Proceedings Article | 5 March 2018 Paper

Phase retrieval for interferometry imaging from microlens array

Zhihao Zhu, Minpu Qiu

Proceedings Volume 10710, 1071028 (2018) https://doi.org/10.1117/12.2317611

KEYWORDS: Interferometry, Reconstruction algorithms, Microlens array, Phase retrieval, Feature extraction, Image restoration, Imaging arrays, Imaging systems, Deconvolution, Image processing

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It was considered to get interferometry data from microlens array and reconstruct initial image through it directly, while which used to be taken to calculate the phase difference to get the structure of objects in measurement technology. It broke through the depend of resolution improvement on the size of apertures, reducing the volume of image system vastly. Nevertheless, on account of the phase deficiency, this method could not show the details well enough to be generally used in measurement and control systems. Through support estimation of the target, with the feature extraction technology, the deconvolution function could be got, by which the sidelobe and pinniform structure in the “ditry” image caused by the lack of frequency could be eliminated, and phase retrieval was done. Simulation did the reconstruction experiment, yet had got relatively good detail presentations.

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