Dr. Zhijie Deng
at Synopsys Inc
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 29 September 2010 Paper
Proceedings Volume 7823, 782341 (2010) https://doi.org/10.1117/12.866197
KEYWORDS: Photomasks, Optical proximity correction, Critical dimension metrology, Integrated optics, Calibration, Semiconducting wafers, Optical simulations, Process control, Control systems, Scanning electron microscopy

Proceedings Article | 30 October 2007 Paper
Proceedings Volume 6730, 67302N (2007) https://doi.org/10.1117/12.747444
KEYWORDS: Photomasks, 3D modeling, Polarization, Optical proximity correction, Maxwell's equations, Finite-difference time-domain method, Lithography, Process modeling, Modulation, Resolution enhancement technologies

Proceedings Article | 21 March 2007 Paper
Proceedings Volume 6521, 65211M (2007) https://doi.org/10.1117/12.712513
KEYWORDS: 3D modeling, Photomasks, Atrial fibrillation, Optical proximity correction, Lithography, Near field, Resolution enhancement technologies, TCAD, Performance modeling, 3D metrology

Proceedings Article | 21 March 2006 Paper
Proceedings Volume 6130, 613008 (2006) https://doi.org/10.1117/12.660171
KEYWORDS: Crystals, Slow light, Distortion, Prisms, Two wave mixing, Optical amplifiers, Laser crystals, Refractive index, Signal detection, Electromagnetism

Proceedings Article | 23 May 2005 Paper
Proceedings Volume 5842, (2005) https://doi.org/10.1117/12.610309
KEYWORDS: Crystals, Slow light, Laser crystals, Two wave mixing, Refractive index, Distortion, Solids, Signal detection, Transparency, Photonic crystals

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top