Zirui Gao
at Paul Scherrer Institut
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2022 Presentation
Proceedings Volume 12242, 122420B (2022) https://doi.org/10.1117/12.2633570
KEYWORDS: X-rays, X-ray characterization, Scattering, Composites, Tomography, Nanostructures, Spatial resolution, Coherence imaging, Temporal resolution, Solids

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