Lateral Shearing Interferometer (LSI), as a kind of self-interference technology, can achieve high-precision wavefront sensing and phase imaging. Quadriwave Lateral Shearing Interferometry (QWLSI) divides the wavefront into four transverse dislocated beams by a checkerboard phase grating. The lateral-shearing interferogram of the four waves occurs on the image plane, and then the test wavefront is reconstructed. The reconstruction precision is determined by the shear ratio, thus the variable shear ratio can meet the requirement of the different measurement accuracy. Here we proposed variable-ratio lateral-shearing interferometry with a vortex-splitting grating. Different from the checkerboard grating, topological charge is first encoded into grating and is then optimized to obtain two shear ratios in the same interference setup. The proposed variable-ratio lateral-shearing setup including of only an axial motion device is robust, effective and variable precision for wavefront sensing.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.