Omar Alkorjia
at University of Missouri Columbia
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 June 2019 Paper
Proceedings Volume 11002, 110021M (2019) https://doi.org/10.1117/12.2519254
KEYWORDS: Microbolometers, Silicon, Annealing, Infrared radiation, Absorption, Resistance, Aluminum, Long wavelength infrared, Temperature metrology, Fabry–Perot interferometers

Proceedings Article | 4 June 2019 Paper
Proceedings Volume 11002, 110021L (2019) https://doi.org/10.1117/12.2519093
KEYWORDS: Microbolometers, Silicon, Infrared radiation, Germanium, Oxides, Annealing, Resistance, Infrared technology, FSS based metamaterials, Infrared sensors

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