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8 October 2018 Development of energy dispersive x-ray diffraction system for identifying dangerous materials
Yifan Chen, Xin Wang, Baozhong Mu, Qinghua Song
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Proceedings Volume 10802, Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies II; 1080202 (2018) https://doi.org/10.1117/12.2324616
Event: SPIE Security + Defence, 2018, Berlin, Germany
Abstract
Energy dispersive X-ray diffraction (EDXRD) is proposed to be a promising technique for identifying dangerous materials. This paper focuses on the development of the EDXRD system. A high-energy-resolution system using a room temperature detector was established. The diffraction angle of the system was adjustable depending on the detected samples and some experiments were carried out to study the suitable diffraction angle for different samples. At a nominal diffraction angle of 5°, the energy resolution of the system was approximately 6-9%. The system could effectively inspect the concealed samples and obtain the distinguishable profiles through the packaging. These experimental results demonstrated that the EDXRD system could satisfy the requirement of security inspection.
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Yifan Chen, Xin Wang, Baozhong Mu, and Qinghua Song "Development of energy dispersive x-ray diffraction system for identifying dangerous materials", Proc. SPIE 10802, Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies II, 1080202 (8 October 2018); https://doi.org/10.1117/12.2324616
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KEYWORDS
Diffraction
Inspection
X-ray diffraction
Photons
Explosives
X-rays
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