Paper
22 May 1995 Direct measurement of optical constants of metals from a KrF excimer using polarization methods
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Abstract
A simple null modulation-polarization method of measuring optical constants of metals has been adapted for operation with a KrF 248 nm excimer laser. The approach requires only 3 optical components to extract the real and imaginary parts of the index of refraction (n,k). Experimental results will show good agreement to reference values for several metals (Cr, Au, Al) and Si.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Suleyman Turgut and Bruce W. Smith "Direct measurement of optical constants of metals from a KrF excimer using polarization methods", Proc. SPIE 2439, Integrated Circuit Metrology, Inspection, and Process Control IX, (22 May 1995); https://doi.org/10.1117/12.209235
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KEYWORDS
Metals

Excimers

Optical testing

Polarization

Aluminum

Chromium

Excimer lasers

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