Paper
4 December 1998 A theoretical assessment of optical reflectometry for film chemical sensors
Augusto Garcia-Valenzuela, J. M. Saniger-Blesa, C. Garcia-Segundo
Author Affiliations +
Abstract
We investigate theoretically the limits to the resolution imposed by the fundamental optical noises in film-based chemical sensors interrogated by optical reflectometry. We suggest a dynamic reflectometry approach as a possible technique to achieve the ultimate resolution. We find that a theoretical resolution around 1010 absorbed analyte molecules/cm2 is possible in different cases. In the case of conducting films appreciably lower values may be possible.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Augusto Garcia-Valenzuela, J. M. Saniger-Blesa, and C. Garcia-Segundo "A theoretical assessment of optical reflectometry for film chemical sensors", Proc. SPIE 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications, (4 December 1998); https://doi.org/10.1117/12.328628
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KEYWORDS
Reflectometry

Molecules

Dielectrics

Semiconductors

Thermography

Information operations

Interference (communication)

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