Paper
4 June 2002 Beyond 850 nm: progress at other wavelengths and implications from the standard
Jim A. Tatum, Mary K. Hibbs-Brenner, J. Robert Biard, Andrew Clark, J. Allen Cox, James K. Guenter, Robert A. Hawthorne III, Klein Johnson, Ralph H. Johnson, J. Kim, Yue Liu, Fouad Nusseibeh, Gyoungwon Park
Author Affiliations +
Abstract
Born of necessity of application, the Vertical Cavity Surface Emitting Laser (VCSEL) is now found in nearly all optical networking systems based on standards such as the IEEE 802.3z and ANSI X3.t11. Reliability continues to be the hallmark of the technology, and the volume manufacturing aspects are now realized. While VCSEls satisfying optical networking standards continue to provide the highest volume applications, the advantages of the technology are beginning to enable novel optical equipment. This paper explores development of VCSELs at wavelengths from 650 to 850nm, and the commercial applications of these devices in both the data communications and optical sensing arenas. VCSELs operating at longer wavelengths are also being developed, but are not at a stage of commercialization to be discussed in this forum.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jim A. Tatum, Mary K. Hibbs-Brenner, J. Robert Biard, Andrew Clark, J. Allen Cox, James K. Guenter, Robert A. Hawthorne III, Klein Johnson, Ralph H. Johnson, J. Kim, Yue Liu, Fouad Nusseibeh, and Gyoungwon Park "Beyond 850 nm: progress at other wavelengths and implications from the standard", Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); https://doi.org/10.1117/12.469216
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Cited by 4 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Reliability

Optics manufacturing

Standards development

Control systems

Dielectrics

Manufacturing

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