Paper
2 August 2004 Two-point diffraction interferometer for absolute distance measurement
Author Affiliations +
Abstract
We describe a novel method of measuring absolute distances by using a two-point diffraction source specially devised to generate two high quality spherical waves simultaneously with a small lateral offset. Interference of the generated two spherical waves produces a unique ellipsoidal phase distribution in the measurement space. A partial map of the resulted interference phase field is sampled and fitted to a geometric model of multilateration that allows absolute-distance measurements to be performed without 2π-ambiguity. The partial phase map may be obtained by use of either homodyne or heterodyne phase measuring technique. Test results demonstrate that high precision with 1 part in 106 uncertainty can be achieved over 1 meter distance range.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seung-Woo Kim, Hyug-Gyo Rhee, Jiyoung Joo, and Young Jin Kim "Two-point diffraction interferometer for absolute distance measurement", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); https://doi.org/10.1117/12.558834
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Cited by 1 scholarly publication.
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KEYWORDS
Interferometers

Diffraction

Spherical lenses

Heterodyning

Charge-coupled devices

Homodyne detection

Distance measurement

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