Study of growth defects in CZT and their influence on detector uniformity

Giuseppe S. Camarda; Gabriella A. Carini; Zhong Zhong; D. Peter Siddons; Aleksey E. Bolotnikov; Gomez W. Wright; Ralph B. James

doi:10.1117/12.562813

21 October 2004 Study of growth defects in CZT and their influence on detector uniformity

Giuseppe S. Camarda, Gabriella A. Carini, Zhong Zhong, D. Peter Siddons, Aleksey E. Bolotnikov, Gomez W. Wright, Ralph B. James

Author Affiliations +

Proceedings Volume 5540, Hard X-Ray and Gamma-Ray Detector Physics VI; (2004) https://doi.org/10.1117/12.562813
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

The main problems involved in applying Cadmium Zinc Telluride (CZT) to detectors are the crystal perfection required and the difficulty in making reliable surface electrical contacts to the material. Our efforts have focused on the development of interconnect techniques and testing methods which will allow us to explore the interaction of defects with detector properties. Local stoichiometry variations and other local disordering make it very hard to find a systematic correlation between performance and material defects in the macroscopic scale. In order to understand the factors limiting the energy resolution of CZT detectors, our efforts were directed to the area of material characterization and detector testing using the National Synchrotron Light Source (NSLS). NSLS provides us with a highly collimated high intensity X-ray beam, which is employed to investigate micron-scale detector performance mapping and the correlation between microscopic defects and fluctuations in collected charge. Some results were already published and more are presented and correlated to X-ray diffraction topography (XDT) measurements. XDT at the beamline X17B1 is used to investigate more systematically the origins of the mosaicity that can give us information about the defect distribution and strains in bulk CZT crystals.

Citation Download Citation

Giuseppe S. Camarda, Gabriella A. Carini, Zhong Zhong, D. Peter Siddons, Aleksey E. Bolotnikov, Gomez W. Wright, and Ralph B. James "Study of growth defects in CZT and their influence on detector uniformity", Proc. SPIE 5540, Hard X-Ray and Gamma-Ray Detector Physics VI, (21 October 2004); https://doi.org/10.1117/12.562813

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available