Paper
21 December 2013 Talbot effect under illuminated by ultrashort laser pulses with complex spectral distribution
Wei Wang, Hong Zhu, Zhiqiang Liang, Jianzhong Chen, Changhong Yi
Author Affiliations +
Proceedings Volume 9047, 2013 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication; 90470J (2013) https://doi.org/10.1117/12.2038162
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
When periodic structures are illuminated by a monochromatic continuous light source, the exact images of themselves at certain distances can be observed in the Fresnel diffraction region, and this is the so-called Talbot effect. The Talbot effect has attracted more and more attention because of its wide ranging applications in fields which include optical measurement, optical array illumination, and optical interconnections. Following the rapid development in the techniques of ultrashort laser, therefore, it is necessary to study behaviors of the Talbot effect under ultrashort laser pulses illumination. In this paper, the Talbot effect under illuminated by ultrashort laser pulses with complex spectral distribution has been studied. By using a Michelson interferometer, ultrashort laser pulses with complex spectral distribution can be generated based on the spectral interference of ultrashort laser pulses. In experiments, the Talbot images of a grating under illuminated by ultrashort laser pulses with different complex spectral distributions are obtained. Experimental results are in good agreement with the theoretical analysis. We believed that the behaviors of the Talbot effect should have potential applications in optical measurement.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Wang, Hong Zhu, Zhiqiang Liang, Jianzhong Chen, and Changhong Yi "Talbot effect under illuminated by ultrashort laser pulses with complex spectral distribution", Proc. SPIE 9047, 2013 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, 90470J (21 December 2013); https://doi.org/10.1117/12.2038162
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KEYWORDS
Ultrafast phenomena

Optical testing

Beam splitters

Mirrors

Light sources

Michelson interferometers

Near field diffraction

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