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6 October 2023 Combining wave-optical and ray-tracing calculations in x-ray reflective optical systems
Hidekazu Mimura, Yoko Takeo, Hiroto Motoyama, Satoru Egawa, Takashi Kimura, Yasunori Senba, Takashi Tanaka, Haruhiko Ohashi
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Proceedings Volume PC12697, Advances in Computational Methods for X-Ray Optics VI; PC1269702 (2023) https://doi.org/10.1117/12.2678528
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States
Abstract
Coherent or partially coherent X-rays have recently been utilized in beamlines at advanced synchrotron radiation facilities and X-ray free-electron lasers. Wave-optical and ray-tracing calculations are widely employed to predict intensity and phase distributions of X-ray beams when designing new beamlines. Both calculation methods have their respective advantages and disadvantages. In this presentation, we will compare the results of calculations in optical systems that use X-ray focusing mirrors, and introduce a method for combining these two methods. Furthermore, we will discuss the applications of this method for calculating partially coherent X-rays.
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Hidekazu Mimura, Yoko Takeo, Hiroto Motoyama, Satoru Egawa, Takashi Kimura, Yasunori Senba, Takashi Tanaka, and Haruhiko Ohashi "Combining wave-optical and ray-tracing calculations in x-ray reflective optical systems", Proc. SPIE PC12697, Advances in Computational Methods for X-Ray Optics VI, PC1269702 (6 October 2023); https://doi.org/10.1117/12.2678528
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KEYWORDS
X-rays
X-ray optics
Free electron lasers
Mirrors
Partial coherence
Phase distribution
Synchrotron radiation
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