R. Stern, R. Catura, R. Kimble, A. Davidsen, M. Winzenread, M. Blouke, R. Hayes, D. Walton, J. Culhane
Optical Engineering, Vol. 26, Issue 9, 269875, (September 1987) https://doi.org/10.1117/12.7974165
TOPICS: Charge-coupled devices, Ultraviolet radiation, Extreme ultraviolet, Quantum efficiency, Sensors, Detector development, Image sensors, Environmental sensing, Absorption, Silicon
We present results of a program to enhance the ultraviolet and extreme ultraviolet response of charge-coupled devices. The ultimate goal of our program is to develop a large format device with both high and stable quantum efficiency from 100 to 3000 A that can be used as a windowless imaging detector in a space environment. Ultraviolet quantum efficiency measurements have been made for several ion-implanted and laser-annealed test CCDs specially fabricated by Tektronix for this program. Quantum efficiencies as high as 22% at 2500 A , where the absorption depth in silicon is -55 A, have been observed in one such test CCD. Quantum efficiency measurements of standard back-illuminated RCA and Tektronix CCDs are also presented.