Mr. Aitor Matilla Ayala Profile

Aitor Matilla Ayala

at Sensofar Tech SL

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 20 June 2021 Presentation + Paper

Metrological characterization of different methods for recovering the optically sectioned image by means of structured light

P. Martínez, C. Bermudez, G. Carles, C. Cadevall, A. Matilla, J. Marine, R. Artigas

Proceedings Volume 11782, 117820Q (2021) https://doi.org/10.1117/12.2592371

KEYWORDS: Confocal microscopy, Microscopes, Metrology, Reconstruction algorithms, Image filtering, 3D metrology

Read Abstract +

Proceedings Article | 1 April 2020 Presentation + Paper

Three-dimensional imaging confocal profiler without in-plane scanning

Pol Martínez, Carlos Bermudez, Cristina Cadevall, Aitor Matilla Ayala, Roger Artigas

Proceedings Volume 11352, 113520L (2020) https://doi.org/10.1117/12.2554716

KEYWORDS: Confocal microscopy, Microscopes, 3D metrology, 3D scanning, Interferometry, Microscopy

Read Abstract +

Most 3D metrological microscopes used today require a scanning through the optical axis, which is time consuming. The common techniques are Coherence Scanning Interferometry (CSI), Imaging Confocal Microscopy (ICM), and Focus Variation (FV). If one technique is good for smooth surfaces, it is not for rough ones, while the good for rough is too noisy for smooth ones. Additionally, high local slopes are also dependent on the scattering properties of the surface, making the Numerical Aperture of the objective the most important property of the microscope. Imaging Confocal Microscopy is the best compromise in terms of surface application range (from smooth to rough), high local slopes on shiny surfaces, highest numerical aperture and highest possible magnification. Unfortunately, any kind of Confocal microscope today (laser scan, disc scan or microdisplay scan) requires an in-plane scanning to build up the confocal image in addition to the vertical scan, increasing the total measuring time in comparison to CSI and FV. This is against the needs of quality control in production environments, where scanning speed must be as short as possible. In this paper, we use a Microdisplay Scanning Microscope for obtaining the confocal image only relying on a single image per plane. We use a structured illumination to project a desired pattern onto the surface with a very well-defined frequency and direction. By means of the Hilbert transform, we digitally shift the projected pattern one or many times to recover the bright field and the optical sectioned images. This new method reduces significantly the measurement time, simplifies the overall cost of the system and eliminates the maintenance of scanning devices, while maintaining the optical sectioning properties of each plane. We also studied the performance of the resulting topography in terms of system noise, accuracy, repeatability and fidelity of the surface using different methods to obtain the confocal image. Finally, we also compared the results with true confocal results and with other techniques that require a single image per plane, such as Active illumination Focus Variation (AiFV).

Proceedings Article | 24 May 2018 Presentation + Paper

Residual flatness error correction in three-dimensional imaging confocal microscopes

Carlos Bermudez, André Felgner, Pol Martinez, Aitor Matilla, Cristina Cadevall, Roger Artigas

Proceedings Volume 10678, 106780M (2018) https://doi.org/10.1117/12.2306903

KEYWORDS: Microscopes, Confocal microscopy, Calibration, 3D image processing, Monochromatic aberrations, Error analysis, Cameras

Read Abstract +

Proceedings Article | 26 June 2017 Paper

Confocal unrolled areal measurements of cylindrical surfaces

A. Matilla, C. Bermudez, J. Mariné, D. Martínez, C. Cadevall, R. Artigas

Proceedings Volume 10329, 1032915 (2017) https://doi.org/10.1117/12.2269631

KEYWORDS: Confocal microscopy, 3D metrology, Optical inspection, Microscopes, Interferometry, Image resolution, Calibration, Image sensors, Sensors, Time metrology, Distortion, Microscopy

Read Abstract +

Proceedings Article | 26 June 2017 Paper

Automated stent defect detection and classification with a high numerical aperture optical system

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, Roger Artigas

Proceedings Volume 10334, 103340C (2017) https://doi.org/10.1117/12.2275614

KEYWORDS: Line scan image sensors, Cameras, Binary data, Objectives, Optical inspection, Defect detection, Inspection, Image classification, Visualization, Microscopy, Image visualization, Process control

Read Abstract +

Proceedings Article | 20 February 2017 Paper

Optical stent inspection of surface texture and coating thickness

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, Roger Artigas

Proceedings Volume 10110, 1011007 (2017) https://doi.org/10.1117/12.2249614

KEYWORDS: Inspection, Coating, Optical inspection, 3D metrology, Reflectance spectroscopy, Microscopy, Metrology, 3D image processing, Cameras, Confocal microscopy, Interfaces, Microscopes, Interferometry, Objectives

Read Abstract +

Proceedings Article | 26 April 2016 Paper

Three-dimensional measurements with a novel technique combination of confocal and focus variation with a simultaneous scan

A. Matilla, J. Mariné, J. Pérez, C. Cadevall, R. Artigas

Proceedings Volume 9890, 98900B (2016) https://doi.org/10.1117/12.2227054

KEYWORDS: 3D metrology, Imaging systems, 3D scanning, Confocal microscopy, 3D metrology, Manufacturing, Optics manufacturing, Microscopes, 3D modeling, Interferometry, Inspection, Optical testing, Astatine, Image fusion, Data fusion, Signal to noise ratio, Sensors, Cameras, Objectives, 3D image processing

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years