David Martinez
at Sensofar-Tech SL
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 7 November 2018 Paper
Miikka Järvinen, Tuomas Vainikka , Tapani Viitala, Carlos Bermudez, Roger Artigas, Anton Nolvi, Pol Martinez, Niklas Sandler, Edward Hæggström, Ivan Kassamakov
Proceedings Volume 10819, 108190D (2018) https://doi.org/10.1117/12.2501258
KEYWORDS: Calibration, Standards development, 3D metrology, Solids, 3D image processing, Neodymium, Time metrology, Mirrors, 3D imaging standards, Metrology

Proceedings Article | 23 February 2018 Paper
Carlos Bermudez, Roger Artigas, Pol Martinez, Anton Nolvi, Miikka Järvinen, Edward Hæggström, Ivan Kassamakov
Proceedings Volume 10499, 1049923 (2018) https://doi.org/10.1117/12.2289098
KEYWORDS: Calibration, Standards development, 3D metrology, Stars, Interferometers, Diffraction, Microscopes, Manufacturing, Optical transfer functions, Objectives

Proceedings Article | 26 June 2017 Paper
Proceedings Volume 10329, 1032915 (2017) https://doi.org/10.1117/12.2269631
KEYWORDS: Confocal microscopy, 3D metrology, Optical inspection, Microscopes, Interferometry, Image resolution, Calibration, Image sensors, Sensors, Time metrology, Distortion, Microscopy

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