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Reflection, Scattering, and Diffraction from Surfaces V
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Reflection, Scattering, and Diffraction from Surfaces IV
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Reflection, Scattering, and Diffraction from Surfaces III
14 August 2012 | San Diego, California, United States
Optical Complex Systems: OCS11
5 September 2011 | Marseille, France
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
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Reflection, Scattering, and Diffraction from Surfaces II
2 August 2010 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces
11 August 2008 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2 August 2005 | San Diego, California, United States
Surface Scattering and Diffraction III
5 August 2003 | San Diego, California, United States
Surface Scattering and Diffraction for Advanced Metrology II
9 July 2002 | Seattle, WA, United States
Surface Scattering and Diffraction for Advanced Metrology
1 August 2001 | San Diego, CA, United States
Scattering and Surface Roughness III
1 August 2000 | San Diego, CA, United States
Scattering and Surface Roughness III
22 July 1999 | Denver, CO, United States
Rough Surface Scattering and Contamination
21 July 1999 | Denver, CO, United States
Scattering and Surface Roughness II
21 July 1998 | San Diego, CA, United States
Scattering and Surface Roughness
30 July 1997 | San Diego, CA, United States