Dr. Zu-Han Gu
Retired
SPIE Involvement:
Author
Publications (48)

Proceedings Article | 2 September 2010 Paper
Proceedings Volume 7792, 77920U (2010) https://doi.org/10.1117/12.859139
KEYWORDS: Light, Argon ion lasers, Interferometers, Free space, Glasses, Laser scattering, Scattering, Light sources, Michelson interferometers, Wavefronts

Proceedings Article | 2 September 2010 Paper
E. Méndez, E. García-Guerrero, Zu-Han Gu, T. Leskova, A. Maradudin
Proceedings Volume 7792, 77920T (2010) https://doi.org/10.1117/12.862136
KEYWORDS: Scattering, Laser scattering, Electromagnetism, Electromagnetic scattering, Beam propagation method, Radio propagation, Laser applications, Atmospheric propagation, Laser optics, Astronomical imaging

Proceedings Article | 2 September 2010 Paper
Proceedings Volume 7792, 779206 (2010) https://doi.org/10.1117/12.859143
KEYWORDS: Refraction, Dielectrics, Scattering, Light scattering, Glasses, Interfaces, 3D metrology, Metamaterials, Optical testing, Diffraction

Proceedings Article | 21 August 2009 Paper
Proceedings Volume 7405, 74050P (2009) https://doi.org/10.1117/12.824626
KEYWORDS: Refraction, Dielectrics, Glasses, Scattering, Metamaterials, Negative refraction, Light scattering, Interfaces, Photoresist materials, Surface plasmons

Proceedings Article | 29 August 2008 Paper
Proceedings Volume 7065, 70650D (2008) https://doi.org/10.1117/12.784994
KEYWORDS: Speckle, Feedback loops, Visibility, Mirrors, Metals, Interfaces, Dielectrics, Collimation, Geometrical optics, Glasses

Showing 5 of 48 publications
Proceedings Volume Editor (13)

Showing 5 of 13 publications
Conference Committee Involvement (13)
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
24 August 2011 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces II
2 August 2010 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces
11 August 2008 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2 August 2005 | San Diego, California, United States
Showing 5 of 13 Conference Committees
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