Ali Uzun
at Tyndall National Institute
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 23 April 2019
Ali Uzun, Kasif Teker
JNP, Vol. 13, Issue 02, 026003, (April 2019) https://doi.org/10.1117/12.10.1117/1.JNP.13.026003
KEYWORDS: Silicon carbide, Ultraviolet radiation, Photodetectors, External quantum efficiency, Nanowires, Silicon, Crystals, Scanning electron microscopy, Nanoelectronics, Optoelectronic devices

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