Bill Wahl
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 July 2024 Presentation + Paper
Proceedings Volume 13096, 130961O (2024) https://doi.org/10.1117/12.3019302
KEYWORDS: Cameras, Cryostats, Large Synoptic Survey Telescope, Camera shutters, Vacuum, Optical filters, Tunable filters, Charge-coupled devices, Stanford Linear Collider, Sensors

Proceedings Article | 13 December 2020 Presentation
Aaron Roodman, Tim Bond, Boyd Bowdish, Andrew Bradshaw, Eric Charles, James Chiang, Stephen Cisneros, Seth Digel, Richard Dubois, Al Eisner, Michael Huffer, Anthony Johnson, Steven Kahn, John Ku, Travis Lange, Margaux Lopez, Stuart Marshall, Chris Mendez, Myriam Migliore, Homer Neal, Scott Newbry, Martin Nordby, Dmitry Onoprienko, Marco Oriunno, Shawn Osier, Andrew Rasmussen, Kevin Reil, Vincent Riot, Stefano Russo, Owen Saxton, Adam Snyder, Stephen Tether, John Thayer, Jeff Tice, Massimiliano Turri, Anthony Tyson, Yousuke Utsumi, Justin Wolfe, Duncan Wood, Celine Combet, Ludovic Eraud, Aurélien Barrau, Adrian Shestakov, Steve Ritz, Paul O'Connor, Bill Wahl, Sven Herrmann, Andrei Nomerotski, Pierre Antilogus, Claire Juramy-Gilles, Craig Lage, Dan Polin
Proceedings Volume 11447, 114470K (2020) https://doi.org/10.1117/12.2562740
KEYWORDS: Cameras, Large Synoptic Survey Telescope, Optical filters, CCD cameras, Camera shutters, Control systems, Astronomy, Wavefronts, Astronomical imaging, Image filtering

Proceedings Article | 6 July 2018 Paper
Matthias Kroedel, John Ku, J. Brian Langton, Rafe Schindler, Bill Wahl
Proceedings Volume 10702, 107024O (2018) https://doi.org/10.1117/12.2311977
KEYWORDS: Cameras, Sensors, Large Synoptic Survey Telescope, Metrology, Assembly tolerances, Interfaces, Tolerancing, CCD image sensors, Kinematics, Stanford Linear Collider

Proceedings Article | 5 September 2017 Presentation + Paper
Matthias Kroedel, J. Brian Langton, Bill Wahl
Proceedings Volume 10372, 103720E (2017) https://doi.org/10.1117/12.2275126
KEYWORDS: Ceramics, Large Synoptic Survey Telescope, Cameras, Optics manufacturing, Metrology, Optical benches, Thermography, Sensors, Kinematics

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