Deming Meng
at Univ of Southern California
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2019 Presentation
Proceedings Volume 10928, 1092809 (2019) https://doi.org/10.1117/12.2511260
KEYWORDS: Dielectrics, Edge roughness, Surface roughness, Nanophotonics, Nanofabrication, Nanotechnology, Physics

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top