Dr. Eddy R. Simoen Profile

Dr. Eddy R. Simoen

Sr. Researcher at imec

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 8 January 2013 Paper

Noise characteristics of nanoscaled SOI MOSFETs

Nataliya Lukyanchikova, Nikolay Garbar, Valeriya Kudina, Alexander Smolanka, Eddy Simoen, Cor Claeys

Proceedings Volume 8700, 87000N (2013) https://doi.org/10.1117/12.2017358

KEYWORDS: Dielectrics, Oxides, Field effect transistors, Capacitance, Silicon, Silica, Solids, Nondestructive evaluation, Diagnostics

Read Abstract +

Proceedings Article | 4 March 2010 Paper

Shaping the future of nanoelectronics beyond the Si roadmap with new materials and devices

Marc Heyns, Florence Bellenger, Guy Brammertz, Matty Caymax, Mirco Cantoro, Stefan De Gendt, Brice De Jaeger, Annelies Delabie, Geert Eneman, Guido Groeseneken, Geert Hellings, Michel Houssa, Francesca Iacopi, Daniele Leonelli, Dennis Lin, Wim Magnus, Koen Martens, Clement Merckling, Marc Meuris, Jerome Mitard, Julien Penaud, Geoffrey Pourtois, Marc Scarrozza, Eddy Simoen, Bart Soree, Sven Van Elshocht, William Vandenberghe, Anne Vandooren, Philippe Vereecke, Anne Verhulst, Wei-E Wang

Proceedings Volume 7640, 764003 (2010) https://doi.org/10.1117/12.852587

KEYWORDS: Silicon, Germanium, Interfaces, Oxides, Gallium arsenide, Dielectrics, Quantum wells, Field effect transistors, Heterojunctions, Nanowires

Read Abstract +

Proceedings Article | 25 May 2004 Paper

1/f noise in deep submicron CMOS technology for RF and analogue applications

Mercha Abdelkarim, Eddy Simoen, Stefaan Decoutere, Cor Claeys

Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546962

KEYWORDS: CMOS technology, Oxides, Field effect transistors, Dielectrics, Transistors, Analog electronics, Switching, System on a chip, Denoising, Oscillators

Read Abstract +

Proceedings Article | 25 May 2004 Paper

Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs

Nataliya Lukyanchikova, N. Garbar, A. Smolanka, Eddy Simoen, A. Mercha, Cor Claeys

Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546971

KEYWORDS: Field effect transistors, Silicon, Resistance, Oxides, Semiconducting wafers, Transistors, Time metrology, Measurement devices, Semiconductor physics, Ionization

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years