Dr. James E. Carey Profile

Dr. James E. Carey

Founder at SiOnyx LLC

SPIE Involvement:

Author

Proceedings Article | 28 April 2021 Presentation + Paper

Ultra low light CMOS image sensors

M. Pralle, C. Palsule, C. Vineis, J. Jiang, J. Carey

Proceedings Volume 11741, 117410E (2021) https://doi.org/10.1117/12.2588472

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Proceedings Article | 20 May 2016 Paper

Extending black silicon imaging to backside illumination

C. Palsule, M. Pralle, J. Carey, C. Vineis, J. Jiang

Proceedings Volume 9819, 981904 (2016) https://doi.org/10.1117/12.2223063

KEYWORDS: Quantum efficiency, Silicon, Near infrared, Sensors, CMOS sensors, Image sensors, Imaging systems, Infrared imaging, Infrared radiation, Metals

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Proceedings Article | 5 October 2015 Presentation

IR CMOS: near infrared enhanced digital imaging (Presentation Recording)

Martin Pralle, James Carey, Thomas Joy, Chris Vineis, Chintamani Palsule

Proceedings Volume 9555, 95550D (2015) https://doi.org/10.1117/12.2190366

KEYWORDS: Near infrared, Silicon, Quantum efficiency, Absorption, Infrared imaging, Digital imaging, CMOS sensors, Laser applications, Standards development, Image processing

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Proceedings Article | 26 May 2015 Paper

IR CMOS: the digital nightvision solution to sub-1 mLux imaging

M. Pralle, J. Carey, C. Vineis, T. Joy, C. Palsule, J. Jiang

Proceedings Volume 9451, 945108 (2015) https://doi.org/10.1117/12.2177006

KEYWORDS: Silicon, Sensors, Infrared imaging, Cameras, Image sensors, Quantum efficiency, CMOS sensors, Infrared radiation, CCD image sensors, Imaging systems

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Proceedings Article | 11 June 2013 Paper

IR CMOS: infrared enhanced silicon imaging

M. Pralle, J. Carey, Homayoon Haddad, C. Vineis, J. Sickler, X. Li, J. Jiang, F. Sahebi, C. Palsule, J. McKee

Proceedings Volume 8704, 870407 (2013) https://doi.org/10.1117/12.2015959

KEYWORDS: Silicon, Sensors, Infrared radiation, Infrared imaging, CMOS sensors, Visible radiation, Image sensors, Charge-coupled devices, Quantum efficiency, Imaging systems

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Proceedings Article | 23 May 2013 Paper

Infrared enhanced detection for laser imaging and biometrics

M. Pralle, J. Carey, H. Homayoon, J. Sickler, X. Li, J. Jiang, F. Sahebi, C. Palsule, J. McKee

Proceedings Volume 8734, 87340H (2013) https://doi.org/10.1117/12.2020291

KEYWORDS: Silicon, Infrared radiation, Sensors, Infrared imaging, Biometrics, Near infrared, CMOS sensors, Quantum efficiency, Iris recognition, Image processing

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Proceedings Article | 31 May 2012 Paper

IR CMOS: ultrafast laser-enhanced silicon imaging

J. Jiang, X. Li, C. Palsule, C. Hong, F. Sahebi, M. Pralle, J. Sickler, J. McKee, J. Carey, H. Homayoon

Proceedings Volume 8353, 83533H (2012) https://doi.org/10.1117/12.919530

KEYWORDS: Silicon, Sensors, CMOS sensors, Infrared imaging, Image processing, Semiconductor lasers, Staring arrays, Ultrafast imaging, Infrared radiation, Standards development

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Proceedings Article | 21 May 2011 Paper

IR CMOS: ultrafast laser-enhanced silicon detection

C. Palsule, J. Jiang, J. Carey, J. Sickler, D. Miller, H. Homayoon, J. McKee, M. Pralle, X. Li

Proceedings Volume 8012, 801222 (2011) https://doi.org/10.1117/12.882867

KEYWORDS: Silicon, CMOS sensors, Quantum efficiency, Infrared imaging, Sensors, Semiconductor lasers, Laser processing, Charge-coupled devices, Manufacturing, Infrared lasers

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Proceedings Article | 4 May 2010 Paper

Black silicon enhanced photodetectors: a path to IR CMOS

D. Miller, S. Alie, J. McKee, C. Palsule, J. Sickler, M. Pralle, H. Homayoon, J. Jiang, X. Li, J. Carey

Proceedings Volume 7660, 76600N (2010) https://doi.org/10.1117/12.849683

KEYWORDS: Silicon, Quantum efficiency, Sensors, Photodetectors, Infrared imaging, Semiconductor lasers, CMOS sensors, Manufacturing, Infrared sensors, Infrared radiation

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Proceedings Article | 26 August 2008 Paper

Near-infrared enhanced position-sensitive avalanche photodiodes

Richard Farrell, Frank Robertson, Richard Myers, James Carey, Eric Mazur

Proceedings Volume 7055, 70550L (2008) https://doi.org/10.1117/12.794866

KEYWORDS: Sensors, Avalanche photodetectors, Near infrared, Silicon, Quantum efficiency, Head, Semiconductor lasers, Photodiodes, Amplifiers, Avalanche photodiodes

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SPIE Journal Paper | 1 February 2008

Luminescence of black silicon

Ali Serpengüzel, Adnan Kurt, Ibrahim Inanc, James Cary, Eric Mazur

JNP, Vol. 2, Issue 01, 021770, (February 2008) https://doi.org/10.1117/12.10.1117/1.2896069

KEYWORDS: Silicon, Semiconductor lasers, Luminescence, Silicon photonics, Pulsed laser operation, Semiconducting wafers, Scanning electron microscopy, Femtosecond phenomena, Optical communications, Infrared radiation

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Proceedings Article | 18 June 2004 Paper

Temperature dependence of photoluminescence in noncrystalline silicon

Adnan Kurt, Ibrahim Inanc, Temel Bilici, Jim Carey, Ali Serpenguzel, Eric Mazur

Proceedings Volume 5349, (2004) https://doi.org/10.1117/12.529549

KEYWORDS: Silicon, Luminescence, Amorphous silicon, Atomic force microscopy, Temperature metrology, Semiconductor lasers, Physics, Crystals, Optical microcavities, Optoelectronics

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Showing 5 of 12 publications

Conference Committee Involvement (10)

Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XV

8 February 2015 | San Francisco, California, United States

Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIV

2 February 2014 | San Francisco, California, United States

Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XIII

3 February 2013 | San Francisco, California, United States

Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XII

22 January 2012 | San Francisco, California, United States

Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI

23 January 2011 | San Francisco, California, United States

Showing 5 of 10 Conference Committees

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