Ms. Joleyn E. Balch Profile

Joleyn E. Balch

at GE Research

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 11 October 2007 Paper

Diameter distribution of thermally evaporated indium metal islands on silicon substrates

Joleyn Balch, Loucas Tsakalakos, William Huber, James Grande, Michael Knussman, Timothy Cale

Proceedings Volume 6768, 67680A (2007) https://doi.org/10.1117/12.752593

KEYWORDS: Indium, Silicon, Metals, Diffusion, Scanning electron microscopy, Annealing, Image analysis, Hydrogen, Semiconducting wafers, Oxidation

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SPIE Journal Paper | 1 July 2007

Strong broadband optical absorption in silicon nanowire films

Loucas Tsakalakos, Joleyn Balch, Jody Fronheiser, Min-Yi Shih, Stephen LeBoeuf, Matthew Pietrzykowski, Peter Codella, Bas Korevaar, Oleg Sulima, James Rand, Anilkumar Davuluru, Umakant Rapol

JNP, Vol. 1, Issue 01, 013552, (July 2007) https://doi.org/10.1117/12.10.1117/1.2768999

KEYWORDS: Silicon, Absorption, Silicon films, Reflectivity, Solids, Glasses, Thin films, Chemical vapor deposition, Optical properties, Nanowires

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Proceedings Article | 19 October 2006 Paper

Heterogeneous integration of semiconducting and carbide nanowires on Si substrates

Loucas Tsakalakos, Seth Taylor, Reed Corderman, Joleyn Balch, Jody Fronheiser

Proceedings Volume 6370, 637019 (2006) https://doi.org/10.1117/12.696056

KEYWORDS: Silicon, Silicon carbide, Zinc oxide, Gold, Metals, Scanning electron microscopy, Transistors, Semiconductors, Transmission electron microscopy, Nanowires

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