Dr. Mario Garcia Valderas
Industrial Engineer at Univ Carlos III de Madrid
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 28 May 2013 Paper
Proceedings Volume 8764, 876407 (2013) https://doi.org/10.1117/12.2017476
KEYWORDS: Steganalysis, Image processing, Quantization, Field programmable gate arrays, Image analysis, Steganography, Internet, Clocks, Image compression, Digital image processing

Proceedings Article | 28 May 2013 Paper
Anna Vaskova, Marta Portela-Garcia, Mario Garcia-Valderas, Celia López-Ongil, Jorge Portilla, Juan Valverde, Eduardo de la Torre, Teresa Riesgo
Proceedings Volume 8764, 87640L (2013) https://doi.org/10.1117/12.2017474
KEYWORDS: Sensors, Sensor networks, Distributed computing, Tolerancing, Data processing, Data acquisition, Reliability, Chemical elements, Field programmable gate arrays, Humidity

Proceedings Article | 28 May 2009 Paper
Proceedings Volume 7363, 73630X (2009) https://doi.org/10.1117/12.822057
KEYWORDS: Clocks, Field programmable gate arrays, Digital electronics, Content addressable memory, Chemical elements, Instrument modeling, Photomasks, System on a chip, Prototyping, Error analysis

Proceedings Article | 28 May 2009 Paper
M. García Valderas, P. Zumel, A. Lázaro, C. López Ongil, L. Entrena
Proceedings Volume 7363, 73630V (2009) https://doi.org/10.1117/12.822051
KEYWORDS: Digital electronics, Analog electronics, Device simulation, Control systems, Field programmable gate arrays, Digital electronic circuits, Data modeling, Digital signal processing, Electronics, Prototyping

Proceedings Article | 30 June 2005 Paper
Proceedings Volume 5837, (2005) https://doi.org/10.1117/12.608332
KEYWORDS: Tolerancing, Computer aided design, Field programmable gate arrays, Fourier transforms, Control systems, Photomasks, Clocks, Device simulation, Integrated circuits, Failure analysis

Showing 5 of 7 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top