Dr. Michael D. Gerhold
Program Manager for Optoelectronics at US Army Research Office
SPIE Involvement:
Conference Program Committee | Author
Publications (12)

Proceedings Article | 26 February 2016 Paper
A. Franke, M. Hoffmann, L. Hernandez-Balderrama, F. Kaess, I. Bryan, S. Washiyama, M. Bobea, J. Tweedie, R. Kirste, M. Gerhold, R. Collazo, Z. Sitar
Proceedings Volume 9748, 97481G (2016) https://doi.org/10.1117/12.2211700
KEYWORDS: Reflectivity, Metalorganic chemical vapor deposition, Ultraviolet radiation, Deep ultraviolet, Distributed Bragg reflectors, Aluminum nitride, Atomic force microscopy, Optical microcavities, Nanostructures, Aluminum, Reflectors, Interfaces, Semiconducting wafers, Ions, Epitaxy, Stereolithography

Proceedings Article | 8 March 2014 Paper
Marc Hoffmann, James Tweedie, Ronny Kirste, Zachary Bryan, Isaac Bryan, Michael Gerhold, Zlatko Sitar, Ramón Collazo
Proceedings Volume 8986, 89860T (2014) https://doi.org/10.1117/12.2041018
KEYWORDS: Magnesium, Gallium nitride, Doping, Ultraviolet radiation, Annealing, Luminescence, Excitons, Hydrogen, Semiconductors, Metalorganic chemical vapor deposition

Proceedings Article | 4 February 2013 Paper
Marc Hoffmann, Michael Gerhold, Ronny Kirste, Anthony Rice, Christer-Rajiv Akouala, Jinqiao Xie, Seiji Mita, Ramon Collazo, Zlatko Sitar
Proceedings Volume 8631, 86311T (2013) https://doi.org/10.1117/12.2008827
KEYWORDS: Gallium nitride, Etching, Reactive ion etching, Aluminum nitride, Sapphire, Interfaces, Atomic force microscopy, Ultraviolet radiation, Metalorganic chemical vapor deposition, Harmonic generation

SPIE Journal Paper | 1 June 2009 Open Access
JNP, Vol. 3, Issue 01, 031699, (June 2009) https://doi.org/10.1117/12.10.1117/1.3177270
KEYWORDS: Quantum dots, Waveguides, Semiconductor lasers, Photodetectors, Silicon, Laser development, Modulation, Laser applications, Quantum cascade lasers, Near field optics

Proceedings Article | 19 February 2009 Paper
Anuj Dhawan, Michael Gerhold, Yan Du, Veena Misra, Tuan Vo-Dinh
Proceedings Volume 7205, 72050S (2009) https://doi.org/10.1117/12.809887
KEYWORDS: Silicon, Molecules, Nanostructures, Nanolithography, Germanium, Diamond, Raman scattering, Lithography, Metals, Nanowires

Showing 5 of 12 publications
Conference Committee Involvement (42)
Image Sensing Technologies: Materials, Devices, Systems, and Applications XII
13 April 2025 | Orlando, Florida, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications XI
22 April 2024 | National Harbor, Maryland, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications X
1 May 2023 | Orlando, Florida, United States
Physics and Simulation of Optoelectronic Devices XXXI
31 January 2023 | San Francisco, California, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications IX
4 April 2022 | Orlando, Florida, United States
Showing 5 of 42 Conference Committees
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