Dr. John F. Muth Profile

Dr. John F. Muth

at North Carolina State Univ

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Author

Publications (6)

Proceedings Article | 23 February 2018 Paper

Thermal conductivity of bulk and thin film [beta]-Ga2O3 measured by the 3[omega] technique

N. Blumenschein, M. Slomski, P. Paskov, F. Kaess, M. Breckenridge, J. Muth, T. Paskova

Proceedings Volume 10533, 105332G (2018) https://doi.org/10.1117/12.2288267

KEYWORDS: Thin films, Gallium, Tin, Crystals, Transmission electron microscopy, Doping, Sapphire, Oxides

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Proceedings Article | 12 June 2012 Paper

A modulated pulse laser for underwater detection, ranging, imaging, and communications

Brandon Cochenour, Linda Mullen, John Muth

Proceedings Volume 8372, 83720S (2012) https://doi.org/10.1117/12.918711

KEYWORDS: Modulation, Backscatter, Pulsed laser operation, Ranging, Target detection, Receivers, MATLAB, Environmental sensing, Laser scattering, Scattering

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Proceedings Article | 12 August 2009 Paper

A new beam steering concept: Risley gratings

Chulwoo Oh, Jihwan Kim, John Muth, Michael Escuti

Proceedings Volume 7466, 74660J (2009) https://doi.org/10.1117/12.828005

KEYWORDS: Diffraction, Diffraction gratings, Beam steering, Polarization, Liquid crystals, Transmittance, Prisms, Neodymium, Birefringence, Infrared lasers

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Proceedings Article | 1 May 2009 Paper

The potential of wide band-gap semiconductor materials in laser-induced semiconductor switches

Dane Phillips, Eric Smith, Haojun Luo, Patrick Wellenius, John Muth, John Foreman, Henry Everitt

Proceedings Volume 7311, 731109 (2009) https://doi.org/10.1117/12.818741

KEYWORDS: Semiconductors, Semiconductor lasers, Zinc oxide, Gallium nitride, Terahertz radiation, Silicon carbide, Pulsed laser operation, Wide bandgap semiconductors, Switches, Sapphire lasers

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Proceedings Article | 2 February 2007 Paper

Plasmon resonance based in-line fiber optic sensing

M. Gerhold, A. Dhawan, J. Muth

Proceedings Volume 6479, 64790N (2007) https://doi.org/10.1117/12.693028

KEYWORDS: Gold, Nanoparticles, Optical fibers, Sensors, Fiber optics sensors, Plasmons, Annealing, Refractive index, Thin films, Multimode fibers

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Proceedings Article | 21 November 2001 Paper

Improving interconnect characteristics of thin film MEMS processes

Bruce Duewer, David Winick, Andrew Oberhofer, John Muth, Paul Franzon

Proceedings Volume 4592, (2001) https://doi.org/10.1117/12.448966

KEYWORDS: Metals, Resistance, Microelectromechanical systems, Sputter deposition, Capacitors, Gold, Thin films, Oxides, Reflectivity, Microopto electromechanical systems

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Showing 5 of 6 publications

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