Dr. Reiner Dietsch Profile

Dr. Reiner Dietsch

at AXO DRESDEN GmbH

SPIE Involvement:

Author

Publications (11)

Proceedings Article | 15 May 2017 Presentation + Paper

Low-pressure RF remote plasma cleaning of carbon-contaminated B4C-coated optics

H. Moreno Fernández, M. Thomasset, G. Sauthier, D. Rogler, R. Dietsch, R. Barrett, V. Carlino, E. Pellegrin

Proceedings Volume 10236, 102360E (2017) https://doi.org/10.1117/12.2269374

KEYWORDS: Solids, Coating, Argon, Plasma treatment, Plasma, Carbon, Contamination, Free electron lasers, Optical coatings, Optical components, Optical design, Synchrotron radiation

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Proceedings Article | 17 September 2014 Paper

Reflection on multilayer mirrors: beam profile and coherence properties

A. Rack, C. Morawe, L. Mancini, D. Dreossi, D. Parkinson, A. MacDowell, F. Siewert, T. Rack, T. Holz, M. Krämer, R. Dietsch

Proceedings Volume 9207, 92070V (2014) https://doi.org/10.1117/12.2060801

KEYWORDS: Multilayers, Mirrors, Wavefronts, Reflection, X-rays, Light sources, Monochromators, Silicon, Reflectivity, Crystals

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Proceedings Article | 18 February 2011 Paper

High precision deposition of single and multilayer x-ray optics and their application in x-ray analysis

R. Dietsch, T. Holz, M. Krämer, D. Weißbach

Proceedings Volume 7995, 79951U (2011) https://doi.org/10.1117/12.888192

KEYWORDS: X-ray optics, X-rays, Multilayers, Manufacturing, Mirrors, Reflectivity, X-ray fluorescence spectroscopy, X-ray diffraction, Software development, Crystals

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Proceedings Article | 27 August 2010 Paper

Micro-imaging performance of multilayers used as monochromators for coherent hard x-ray synchrotron radiation

A. Rack, T. Weitkamp, M. Riotte, T. Rack, R. Dietsch, T. Holz, M. Krämer, F. Siewert, M. Meduna, Ch. Morawe, P. Cloetens, E. Ziegler

Proceedings Volume 7802, 78020M (2010) https://doi.org/10.1117/12.858355

KEYWORDS: Monochromators, Multilayers, Light sources, Hard x-rays, Photons, Mirrors, X-ray imaging, Synchrotron radiation, Crystals, Coating

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Proceedings Article | 24 December 2002 Paper

High-resolution carbon/carbon multilayers

Alexander Baranov, Reiner Dietsch, Thomas Holz, Maik Menzel, Danny Weissbach, Roland Scholz, Valeri Melov, Juergen Schreiber

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.451361

KEYWORDS: Multilayers, Carbon, X-rays, Reflectivity, X-ray optics, Mirrors, Interfaces, Absorption, Copper, Pulsed laser deposition

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Proceedings Article | 14 November 2001 Paper

Evolution of stress and microstructure in Ni/C multilayers used as x-ray optics in a wide energy range

Reiner Dietsch, Thomas Holz, Danny Weiflbach, Valeri Melov, Juergen Schreiber, Roland Scholz

Proceedings Volume 4501, (2001) https://doi.org/10.1117/12.448484

KEYWORDS: Nickel, X-rays, X-ray optics, Multilayers, Reflectometry, X-ray diffraction, Crystals, Diffraction, Semiconducting wafers, Interfaces

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Proceedings Article | 2 November 2000 Paper

Multilayer x-ray optics for energies E > 8 keV and their application in x-ray analysis

Reiner Dietsch, Stefan Braun, Thomas Holz, Hermann Mai, Roland Scholz, Lutz Bruegemann

Proceedings Volume 4144, (2000) https://doi.org/10.1117/12.405887

KEYWORDS: Reflectivity, Molybdenum, X-rays, Copper, Interfaces, Mirrors, X-ray optics, Nickel, Reflectometry, Multilayers

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Proceedings Article | 23 November 1999 Paper

Laterally graded multilayer optics for x-ray analysis

Manfred Schuster, H. Goebel, Lutz Bruegemann, D. Bahr, F. Burgaezy, Carsten Michaelsen, Michael Stoermer, P. Ricardo, Reiner Dietsch, Thomas Holz, Hermann Mai

Proceedings Volume 3767, (1999) https://doi.org/10.1117/12.371116

KEYWORDS: Mirrors, Multilayers, Reflectivity, X-ray optics, X-rays, Copper, Reflection, Sputter deposition, Silicon, Chromium

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Proceedings Article | 11 March 1996 Paper

Multilayer deposition and nanostructuring by laser methods

Andre Gorbunov, Wolfgang Pompe, Andreas Sewing, A. Akhsakhaljan, Sergey Gaponov, Nikolai Salashchenko, Reiner Dietsch, Hermann Mai, S. Voellmar

Proceedings Volume 2777, (1996) https://doi.org/10.1117/12.232206

KEYWORDS: Plasma, Multilayers, Particles, Nickel, Carbon, Thin films, Tin, Deposition processes, Interfaces, Pulsed laser deposition

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Proceedings Article | 4 November 1994 Paper

Pulsed-laser deposition of x-ray optical layer stacks with atomically flat interfaces

Hermann Mai, Reiner Dietsch, Thomas Holz, S. Voellmar, S. Hopfe, Roland Scholz, Peter Weissbrodt, Rhena Krawietz, B. Wehner, H. Eichler, H. Wendrock

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192079

KEYWORDS: Interfaces, Multilayers, Thin films, X-rays, X-ray optics, Particles, Silicon, Nickel, Molybdenum, X-ray diffraction

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Proceedings Article | 28 July 1994 Paper

Postprocessing of nm-period multilayer structures

A. Gorbunov, Wolfgang Pompe, Reiner Dietsch, Hermann Mai, Michael Panzner, Rhena Krawietz, B. Wehner

Proceedings Volume 2213, (1994) https://doi.org/10.1117/12.180974

KEYWORDS: Nickel, Interfaces, Scanning tunneling microscopy, Crystals, Carbon, Reflectivity, Multilayers, Silicon, Annealing, Transmission electron microscopy

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Showing 5 of 11 publications

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