Mr. Ruslan V. Shimansky Profile

Ruslan V. Shimansky

at Institute of Automation and Electrometry of the SB RAS

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Author

Publications (9)

Proceedings Article | 9 October 2021 Poster + Paper

Diffraction method for estimation of positioning errors that occurred during the writing of computer-generated holograms

Ruslan Shimansky, Victor Korolkov, Dmitrij Belousov, Roman Kuts

Proceedings Volume 11895, 118951B (2021) https://doi.org/10.1117/12.2604292

KEYWORDS: Computer generated holography, Diffraction, Error analysis, Diffraction gratings, Wavefronts, Laser systems engineering, Mathematical modeling, Laser beam diagnostics, Holograms, Reliability

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Proceedings Article | 14 September 2021 Poster + Paper

Principles of operation and prospects for the development of laser lithographic systems for the synthesis of optical elements

V. N. Khomutov, R. V. Shimansky, R. Nasyrov, V. Korolkov

Proceedings Volume 11875, 118750O (2021) https://doi.org/10.1117/12.2597050

KEYWORDS: Control systems, Laser development, Laser systems engineering, Lithography, System on a chip, Optical scanning systems

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Proceedings Article | 12 September 2021 Presentation + Paper

Controlling the accuracy of fabricating computer-generated holograms on circular and X-Y laser writing systems

Ruslan Shimansky, Dmitrij Belousov, Roman Kuts, Victor Korolkov

Proceedings Volume 11871, 118710I (2021) https://doi.org/10.1117/12.2597134

KEYWORDS: Computer generated holography, Diffraction, Laser systems engineering, Diffraction gratings, Error analysis, Wavefronts, Chromium, Diffractive optical elements, Control systems

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Proceedings Article | 10 October 2020 Poster + Presentation + Paper

Dry method for the formation of reflective phase DOEs using direct laser writing on thin Zr films

Victor Korolkov, Roman Kuts, Anatolij Malyshev, Alexey Matochkin, Ruslan Shimansky

Proceedings Volume 11551, 115511O (2020) https://doi.org/10.1117/12.2574196

KEYWORDS: Zirconium, Multiphoton lithography, Reflectivity, Thin films, Oxidation, Metals, Diffractive optical elements, Liquids, Plasma treatment, Silica

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Proceedings Article | 10 October 2020 Poster + Paper

Determination of linewidth for metal/oxide gratings by measured diffraction efficiency in several orders

Dmitrij Belousov, Victor Korolkov, Ruslan Shimansky, Vladimir Khomutov, Roman Kuts

Proceedings Volume 11551, 115511N (2020) https://doi.org/10.1117/12.2574002

KEYWORDS: Diffraction gratings, Diffraction, Multiphoton lithography, Metals, Diffractive optical elements, Algorithm development, Thin film manufacturing, Thin films, Optics manufacturing, Oxidation

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Proceedings Article | 10 October 2020 Presentation + Paper

Measuring fabrication errors of computer-generated holograms using embedded microgratings

Ruslan Shimansky, Ruslan Nasyrov, Dmitrij Belousov

Proceedings Volume 11551, 115510L (2020) https://doi.org/10.1117/12.2573615

KEYWORDS: Computer generated holography, Spindles, Aspheric lenses, Laser systems engineering, Temperature metrology

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Proceedings Article | 23 April 2019 Presentation + Paper

Increasing the spatial resolution of direct laser writing of diffractive structures on thin films of titanium group metals

Victor Korolkov, Andrey Sedukhin, Dmitry Belousov, Ruslan Shimansky, Vladimir Khomutov, Sergey Mikerin, Evgeny Spesivtsev, Roman Kutz

Proceedings Volume 11030, 110300A (2019) https://doi.org/10.1117/12.2520978

KEYWORDS: Metals, Titanium, Zirconium, Thin films, Oxidation, Multiphoton lithography, Reflection, Spatial resolution, Refractive index, Laser systems engineering

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Proceedings Article | 25 September 2008 Paper

Profilometric characterization of DOEs with continuous microrelief

V. Korolkov, S. Ostapenko, R. Shimansky

Proceedings Volume 7102, 710209 (2008) https://doi.org/10.1117/12.797673

KEYWORDS: Diffractive optical elements, Diffraction, Profilometers, Error analysis, Diffraction gratings, Optical components, Optics manufacturing, Optical design, Phase shift keying, Statistical analysis

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Proceedings Article | 9 November 2001 Paper

Requirements and approaches to adapting laser writers for fabrication of gray-scale masks

Victor Korolkov, Ruslan Shimansky, Alexander Poleshchuk, Vadim Cherkashin, Andrey Kharissov, Dmitry Denk

Proceedings Volume 4440, (2001) https://doi.org/10.1117/12.448047

KEYWORDS: Transmittance, Photoresist materials, Global system for mobile communications, Diffractive optical elements, Binary data, Modulation, Calibration, Manufacturing, Optical modulators, Photometry

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Showing 5 of 9 publications

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