Prof. Thomas G. Brown Profile

Prof. Thomas G. Brown

Professor and Director at Institute of Optics Univ of Rochester

SPIE Involvement:

Conference Chair | Conference Program Committee | Editor | Author

Publications (48)

SPIE Journal Paper | 19 March 2024

Teaching optics online: lessons learned from the University of Rochester’s hybrid optics master’s education program

Jennifer D. Kruschwitz, Thomas Brown, James Zavislan

OE, Vol. 63, Issue 07, 071406, (March 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.7.071406

KEYWORDS: Online learning, Video, Optics education, Hybrid optics, Optical engineering, Mathematics, Cameras, Zoom lenses, Glasses, Optical coatings

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Proceedings Article | 13 March 2024 Presentation

From polarimetry to Bessel beams using stress engineered optics

Thomas Brown

Proceedings Volume PC12901, PC129010F (2024) https://doi.org/10.1117/12.3008913

KEYWORDS: Bessel beams, Polarimetry, Polarization, Windows, Physics, Optical engineering, Inhomogeneities, Glasses, Engineering

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Proceedings Article | 13 March 2024 Presentation

Measured response of a synthetic dipole generated in a photonic integrated circuit

Tyler Howard, Thomas Brown

Proceedings Volume PC12848, PC1284807 (2024) https://doi.org/10.1117/12.3007357

KEYWORDS: Polarization, Photonic integrated circuits, Molecules, Microscopy, Light scattering, Calibration, Statistical analysis, Simulations, Short wave infrared radiation, Polarizers

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Proceedings Article | 26 January 2024 Presentation + Paper

Single-shot, spatially resolved, simultaneous polarimetry and wavefront sensing

David Spiecker, Thomas Brown

Proceedings Volume PC12664, PC1266404 (2024) https://doi.org/10.1117/12.3005677

KEYWORDS: Polarimetry, Wavefronts, Wavefront sensors, Polarization, Matrices, Stars, Imaging systems, Birefringence, Poincare sphere, Wavefront errors

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SPIE Journal Paper | 23 November 2023 Open Access

Engineered scattering elements used as optical test points in photonic integrated circuits

Tyler V. Howard, Icel Sukovaty, Thomas G. Brown

JOM, Vol. 4, Issue 01, 011002, (November 2023) https://doi.org/10.1117/12.10.1117/1.JOM.4.1.011002

KEYWORDS: Polarization, Waveguides, Scattering, Light scattering, Photonic integrated circuits, Optical testing, Optical components, Microscopes, Silicon, Finite-difference time-domain method

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Proceedings Article | 4 October 2023 Poster + Paper

Holographic shearing interferometry and its implications for freeform characterization

Demetrious Dowdell, Isabella Feraca, Thomas Brown

Proceedings Volume 12672, 126720S (2023) https://doi.org/10.1117/12.2675532

KEYWORDS: Wavefronts, Holographic interferometry, Interferograms, Phase unwrapping, Holography, Optical surfaces, Holograms, Aspheric lenses, Phase shifting, Reflection

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Proceedings Article | 28 June 2023 Open Access

Course structure for the University of Rochester’s Hybrid Optics Masters Education (HOME) program

Jennifer D. Kruschwitz, Thomas Brown, James Zavislan

Proceedings Volume 12723, 1272308 (2023) https://doi.org/10.1117/12.2666261

KEYWORDS: Video, Online learning, Hybrid optics, Geometrical optics

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Proceedings Article | 16 May 2023 Presentation + Paper

Utilizing fluorescent beads to mimic single fluorophores

Sherry Yi-Ting Feng, Luis Alemán-Castañeda, Rodrigo Gutiérrez-Cuevas, Isael Herrera, Thomas Brown, Sophie Brasselet, Miguel Alonso

Proceedings Volume 12385, 1238506 (2023) https://doi.org/10.1117/12.2664958

KEYWORDS: Point spread functions, Fluorophores, Polarization, Microscopes, Microscopy, Electric fields, Molecules, Super resolution, Refractive index

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Proceedings Article | 17 March 2023 Presentation

LLE and the Institute of Optics: advancing high-power lasers education at the University of Rochester

Leon Waxer, Andrew Berger, Jake Bromage, Julie Bentley, Thomas Brown, Steve Craxton, Terrance Kessler, Jennifer Kruschwitz, Brian Kruschwitz, Gary Wicks, Jonathan Zuegel

Proceedings Volume PC12401, PC1240109 (2023) https://doi.org/10.1117/12.2666268

KEYWORDS: Optics, Laser applications, High power lasers, Technology, Technician training, Optics education, Optical engineering, Laser systems engineering, Laser engineering, Laser energy

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Proceedings Article | 15 March 2023 Presentation

Synthetic dipole generated in a photonic integrated circuit (Conference Presentation)

Tyler Howard, Thomas Brown

Proceedings Volume PC12385, PC1238503 (2023) https://doi.org/10.1117/12.2657699

KEYWORDS: Polarization, Photonic integrated circuits, Molecules, Waveguides, Waveguide modes, Scattering, Poincaré sphere, Phase shift keying, Optical spheres, Molecular imaging

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Proceedings Article | 13 March 2023 Presentation + Paper

Silicon photonics packaging using engineered scattering elements

Tyler Howard, Thomas Brown

Proceedings Volume 12426, 1242605 (2023) https://doi.org/10.1117/12.2651278

KEYWORDS: Polarization, Waveguides, Scattering, Light scattering, Photonic integrated circuits, Design and modelling, Microscopes, Short wave infrared radiation, Finite-difference time-domain method, Silicon

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Proceedings Article | 8 March 2023 Presentation + Paper

Fiber optical coupling with engineered scattering elements

Icel Sukovaty, Tyler Howard, Thomas Brown

Proceedings Volume 12427, 124270A (2023) https://doi.org/10.1117/12.2660199

KEYWORDS: Polarization, Waveguides, Scattering, Light scattering, Silicon, Photonic integrated circuits, Silicon nitride, Fiber couplers, Signal to noise ratio, Polarizers

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Proceedings Article | 11 January 2023 Presentation

Polarization monitoring of photonic integrated circuits using engineered scattering elements

Tyler Howard, Thomas Brown

Proceedings Volume PC12334, PC123340D (2023) https://doi.org/10.1117/12.2645109

KEYWORDS: Polarization, Scattering, Photonic integrated circuits, Light scattering, Optical alignment, Waveguides, Testing and analysis, Short wave infrared radiation, Photon polarization, Optical testing

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Proceedings Article | 2 March 2022 Presentation

Polarimetric microscopy of engineered scatterers in photonic integrated circuits

Thomas Brown, Tyler Howard

Proceedings Volume PC11966, PC1196609 (2022) https://doi.org/10.1117/12.2617656

KEYWORDS: Polarimetry, Photonic integrated circuits, Microscopy, Waveguides, Polarization, Systems modeling, Silicon, Waveguide modes, Wave propagation, Silicon photonics

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Proceedings Article | 6 October 2021 Presentation + Paper

Camera-based metrology of subwavelength scatterers in photonic integrated circuits

Tyler Howard, Thomas Brown

Proceedings Volume 11880, 1188006 (2021) https://doi.org/10.1117/12.2601478

KEYWORDS: Scattering, Light scattering, Waveguides, Polarization, Photonic integrated circuits, Silicon, Microscopes, Cameras, Signal attenuation, Metrology

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Proceedings Article | 9 September 2021 Open Access

James Wyant, east to west, industry to academia: a career of impact and innovation

P. Scott Carney, Thomas Brown

Proceedings Volume 11813, 1181303 (2021) https://doi.org/10.1117/12.2572372

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Proceedings Article | 5 March 2021 Presentation + Paper

Interferometric polarimetry using full-Poincaré beams

Ashan Ariyawansa Galabada Dewage, Thomas Brown

Proceedings Volume 11701, 117010N (2021) https://doi.org/10.1117/12.2582371

KEYWORDS: Interferometry, Polarization, Polarimetry, Point spread functions, Optical spheres, Imaging systems, Calibration, Birefringence, Beam analyzers

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Proceedings Article | 9 March 2020 Presentation

Quantum limited digital holography and the limits of spatial heterodyne detection (Conference Presentation)

Thomas Brown

Proceedings Volume 11245, 1124505 (2020) https://doi.org/10.1117/12.2553471

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Proceedings Article | 13 March 2019 Presentation

Simultaneous detection of 3D orientation and 3D spatial localization of single emitters for nanoscale structural imaging (Conference Presentation)

Sophie Brasselet, Valentina Curcio, Thomas Brown, Miguel Alonso

Proceedings Volume 10883, 1088307 (2019) https://doi.org/10.1117/12.2509891

KEYWORDS: 3D image processing, Structural imaging, 3D metrology, Super resolution, Point spread functions, Molecules, Proteins, Stereoscopy, Microscopes, Polarization

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Proceedings Article | 19 September 2018 Paper

Calibration methods for a dual-wavelength interferometer system

Yanqi Zhang, Martin Tangari Larrategui, Thomas Brown, Jonathan Ellis

Proceedings Volume 10747, 1074707 (2018) https://doi.org/10.1117/12.2323127

KEYWORDS: Wavefronts, Interferometers, Calibration, Interferometry, Imaging systems, Beam splitters, Collimation, Chromatic aberrations, Optical alignment, Sensors

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Proceedings Article | 10 July 2018 Paper

The first polarimeter in astronomy to use a stress-engineered optic (SEO)

Tristan Wolfe, Robert Stencel, Ashan Ariyawansa, Thomas Brown

Proceedings Volume 10706, 107063B (2018) https://doi.org/10.1117/12.2311570

KEYWORDS: Polarization, Calibration, Point spread functions, Polarimetry, Stars, Astronomy, Polarizers, Dielectric polarization, Glasses, Telescopes

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We present a new single-shot, full-Stokes optical astro-polarimeter design using stress-engineered optics (SEOs). The SEO is a cylindrical glass window under static stress by radially-inward forces in three symmetrically-space regions, producing spatially-varying birefringence throughout (Spilman and Brown, Applied Optics IP, 46, 2007), and can be produced by using o-the-shelf supplies and some machining. By collimating light collected by a telescope through the SEO and then focusing it onto a detector, the system's point spread function (PSF) acquires a shape uniquely dependent on the full polarization vector of the input light (Beckley and Brown, Proc. SPIE, 757011, 2010). By measuring the imaged PSFs, the full-Stokes polarization states of all point sources (stars) in the field can ideally be determined from a single exposure and without division of amplitude techniques. Prior to our instrument, these techniques and technology had not yet been applied to astronomy. Aside from filter wheels and focusing elements, our instrument contains no moving parts. The instrument will operate by first taking a set of calibration exposures of 100% polarized light using swap-in polarizers in one of its filter wheels. Once the calibration images are taken, the polarizers are removed form the light path, and the science target (star) is imaged. Using techniques described in this paper, the calibration images allow one to determine the unknown polarization of the science target. This process is repeated in multiple photometric bands at visible wavelengths for color-dependent studies. The successful application of this polarimeter technology in astronomy would mark a step forward for increasing polarimetry efficiency (no temporal modulation required) and simplicity of instrumentation (no spatial modulation required). Contained in this paper are the on-sky commissioning results of our polarimeter on an 0:2m (8in) telescope at the University of Denver, and an in-depth look at the effect of Earth's atmospheric turbulence on the polarization-dependent PSF detection. We have also begun testing the instrument's capabilities in measuring both linear and circular interstellar polarization, and a look at the variability of historic polarized and unpolarized "standard" stars. Better understanding of the interstellar component of the polarization of stars and the nature of calibration stars are required for all future polarimetric measurements. The authors are grateful to the estate of William Herschel Womble for the support of astronomy at the University of Denver.

Proceedings Article | 5 September 2014 Paper

Measurement of spatial coherence through the shadow of small obscurations

Katelynn Sharma, James Wood, Miguel Alonso, Thomas Brown

Proceedings Volume 9205, 92050G (2014) https://doi.org/10.1117/12.2071108

KEYWORDS: Spatial coherence, Spatial light modulators, Fourier transforms, Charge-coupled devices, Projection systems, MATLAB, Optical testing, Statistical optics, Medical imaging, Optical lithography

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Proceedings Article | 2 April 2014 Paper

Weak measurements applied to process monitoring using focused beam scatterometry

Thomas Brown, Miguel Alonso, Anthony Vella, Michael Theisen, Stephen Head

Proceedings Volume 9050, 90501F (2014) https://doi.org/10.1117/12.2046528

KEYWORDS: Polarization, Scatterometry, Scattering, Semiconductors, Oxides, Quantum mechanics, Signal processing, Scatter measurement, Light scattering, Polarization control

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Proceedings Article | 12 March 2014 Paper

Focused beam scatterometry for deep subwavelength metrology

Thomas Brown, Miguel Alonso, Anthony Vella, Michael Theisen, Stephen Head, Steven Gillmer, Jonathan Ellis

Proceedings Volume 8949, 89490Y (2014) https://doi.org/10.1117/12.2045651

KEYWORDS: Scatterometry, Polarization, Dielectric polarization, Scattering, Light scattering, Metrology, Semiconductors, Critical dimension metrology, Laser scattering, Oxides

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Proceedings Article | 12 March 2014 Paper

Pinhole array implementation of star test polarimetry

Brandon Zimmerman, Roshita Ramkhalawon, Miguel Alonso, Thomas Brown

Proceedings Volume 8949, 894912 (2014) https://doi.org/10.1117/12.2042093

KEYWORDS: Polarization, Polarimetry, Point spread functions, Stars, Relays, CCD cameras, Calibration, Microscopy, Optical components, Optical engineering

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Proceedings Article | 12 March 2014 Paper

Amplitude, phase, and polarization control with a single spatial light modulator

Michael Theisen, Stephen Head, Thomas Brown, Steven Gillmer, Jonathan Ellis

Proceedings Volume 8949, 89491X (2014) https://doi.org/10.1117/12.2045965

KEYWORDS: Polarization, Spatial light modulators, Polarization control, Calcite, Wave plates, Beam splitters, Polarimetry, Crystals, Optical spheres, Interferometers

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Proceedings Article | 15 October 2012 Paper

Exploring new polarimetric techniques using unconventionally polarized sources

Brandon Zimmerman, Per Adamson, Thomas Brown, Jose Vanderlei Martins

Proceedings Volume 8515, 85150Q (2012) https://doi.org/10.1117/12.928014

KEYWORDS: Polarimetry, Scattering, Polarization, Aerosols, Laser scattering, Atmospheric particles, Superposition, Poincaré sphere, Prisms, Light scattering

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Proceedings Article | 3 February 2012 Paper

Star test polarimetry using stress-engineered optical elements

Roshita Ramkhalawon, Amber Beckley, Thomas Brown

Proceedings Volume 8227, 82270Q (2012) https://doi.org/10.1117/12.908472

KEYWORDS: Polarization, Point spread functions, Polarimetry, Optical components, Stars, Calibration, Imaging systems, Image processing, Microscopy, Glasses

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Proceedings Article | 3 February 2012 Paper

Measurement of the polarimetric response of suspended gallium doped silicon nanowires

Michael Theisen, Brian McIntyre, Thomas Brown

Proceedings Volume 8227, 82270P (2012) https://doi.org/10.1117/12.908460

KEYWORDS: Polarimetry, Etching, Gallium, Silicon, Polarization, Microscopes, Wave plates, Reactive ion etching, Wet etching, Nanowires

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Proceedings Article | 25 October 2011 Paper

Full Poincaré beams

Miguel Alonso, Amber Beckley, Thomas Brown

Proceedings Volume 8011, 80111M (2011) https://doi.org/10.1117/12.903258

KEYWORDS: Polarization, Optical spheres, Superposition, Beam propagation method, Wave plates, Birefringence, Radio propagation, Laser scattering, Scattering, Particles

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Proceedings Article | 9 September 2010 Paper

Imprinting aberrations in the Stokes parameters of a focal spot

Amber Beckley, Thomas Brown

Proceedings Volume 7652, 76521V (2010) https://doi.org/10.1117/12.869058

KEYWORDS: Point spread functions, Polarization, Monochromatic aberrations, Optical components, Wavefront aberrations, Apodization, Birefringence, Optical filters, Inspection, Imaging systems

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Proceedings Article | 25 February 2010 Paper

Pupil polarimetry using stress-engineered optical elements

Amber Beckley, Thomas Brown

Proceedings Volume 7570, 757011 (2010) https://doi.org/10.1117/12.848970

KEYWORDS: Polarization, Polarimetry, Optical components, Genetic algorithms, Imaging systems, Apodization, Spiral phase plates, Bismuth, Charge-coupled devices, Optical testing

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Proceedings Article | 13 February 2009 Paper

Coherence measurements applied to critical and Köhler vortex illumination

Dean Brown, Thomas Brown

Proceedings Volume 7184, 71840B (2009) https://doi.org/10.1117/12.809318

KEYWORDS: Polarization, Imaging systems, Image analysis, Feature extraction, Microscopy, Dielectric polarization, Coherence (optics), Glasses, Interferometers, CCD cameras

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Proceedings Article | 17 September 2008 Paper

The Robert E. Hopkins Center for Optical Design and Engineering

James Zavislan, Thomas Brown

Proceedings Volume 7061, 70610U (2008) https://doi.org/10.1117/12.796822

KEYWORDS: Optical engineering, Optical design, Optics, Electro-optical engineering, Optical fabrication, Physics, Optical tracking, Optical testing, Metrology, Laser energy

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In 1929, a grant from Eastman Kodak and Bausch and Lomb established The Institute of Optics as the nation's first academic institution devoted to training optical scientists and engineers. The mission was 'to study light in all its phases', and the curriculum was designed to educate students in the fundamentals of optical science and build essential skills in applied optics and optical engineering. Indeed, our historic strength has been a balance between optical science and engineering--we have alumni who are carrying out prize-winning research in optical physics, alumni who are innovative optical engineers, and still other alumni who are leaders in the business community. Faculty who are top-notch optical engineers are an important resource to optical physics research groups -- likewise, teaching and modeling excellent optical science provides a strong underpinning for students on the applied/engineering end of the spectrum. This model -an undergraduate and graduate program that balances fundamental optics, applied optics, and optical engineering- has served us well. The impressive and diverse range of opportunities for our BS graduates has withstood economic cycles, and the students graduate with a healthy dose of practical experience. Undergraduate advisors, with considerable initiative from the program coordinator, are very aggressive in pointing students toward summer research and engineering opportunities. The vast majority of our undergraduate students graduate with at least one summer of experience in a company or a research laboratory. For example, 95% of the class of 2008 spent the summer of 2007 at companies and/or research laboratories: These include Zygo, NRL, Bausch and Lomb, The University of Rochester(The Institute of Optics, Medical Center, and Laboratory for Laser Energetics), QED, ARL Night Vision laboratories, JPL, Kollsman, OptiMax, Northrup Grumman, and at least two other companies. It is an impressive list, and bodes well for the career preparation for these students. While this extracurricular experience is truly world-class, an integrated design experience defined within our academic program is increasingly necessary for those going on to professional careers in engineering. This paper describes the philosophy behind a revision to our undergraduate curriculum that integrates a design experience and describes the engineering laboratory that has been established to make it a reality. The laboratory and design center has been named in honor of Robert E. Hopkins, former director and professor, co-founder of Tropel corporation, and a lifelong devotee to engineering innovation.

Proceedings Article | 18 September 2007 Paper

Polarization vortices in optical design

Thomas Brown

Proceedings Volume 6667, 66670H (2007) https://doi.org/10.1117/12.731963

KEYWORDS: Polarization, Imaging systems, Lithographic illumination, Confocal microscopy, Optical design, Apodization, Reticles, Immersion lithography, Microscopy, Birefringence

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Proceedings Article | 18 September 2007 Paper

Focal splitting and optical vortex structure induced by stress birefringence

Alexis Spilman, Amber Beckley, Thomas Brown

Proceedings Volume 6667, 66670I (2007) https://doi.org/10.1117/12.733828

KEYWORDS: Polarization, Birefringence, Zone plates, Photography, Phase shift keying, Diffraction gratings, Diffraction, Interferometry, Optical vortices, Circular polarizers

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Proceedings Article | 10 September 2007 Paper

Calibration of a reversed-wavefront interferometer for polarization coherence metrology

Dean Brown, Alexis Spilman, Thomas Brown, Miguel Alonso, Riccardo Borghi, Massimo Santarsiero

Proceedings Volume 6672, 667207 (2007) https://doi.org/10.1117/12.734526

KEYWORDS: Polarization, Calibration, Interferometers, Visibility, Beam splitters, Circular polarizers, Wavefronts, Cameras, Polarization coherence, Electromagnetism

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Proceedings Article | 23 February 2006 Paper

Refractive index imaging via a chemically amplified process in a solid polymeric medium

Douglas Robello, Samir Farid, Joseph Dinnocenzo, Thomas Brown

Proceedings Volume 6117, 61170F (2006) https://doi.org/10.1117/12.658458

KEYWORDS: Refractive index, Polymers, Solids, Imaging systems, Holography, Photorefractive polymers, Diffraction gratings, Diffraction, Energy transfer, Molecules

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Proceedings Article | 9 July 2003 Paper

Longitudinal field imaging

David Biss, Kathleen Youngworth, Thomas Brown

Proceedings Volume 4964, (2003) https://doi.org/10.1117/12.478347

KEYWORDS: Polarization, Point spread functions, Confocal microscopy, Interfaces, Light scattering, Dielectric polarization, Image resolution, Particles, Imaging systems, Objectives

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Proceedings Article | 23 December 2002 Paper

Inhomogeneous polarization in optical system design

Thomas Brown

Proceedings Volume 4832, (2002) https://doi.org/10.1117/12.486472

KEYWORDS: Polarization, Optical design, Lithographic illumination, Imaging systems, Particles, Confocal microscopy, Inspection, Light scattering, Interfaces, Reticles

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Proceedings Article | 16 April 2001 Paper

Point spread functions for particle imaging using inhomogeneous polarization in scanning optical microscopy

Kathleen Youngworth, David Bliss, Thomas Brown

Proceedings Volume 4261, (2001) https://doi.org/10.1117/12.424532

KEYWORDS: Polarization, Point spread functions, Beam splitters, Microscopes, Mirrors, Particles, Wave plates, Microscopy, Imaging systems, Optical microscopy

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Proceedings Article | 2 May 2000 Paper

Inhomogenous polarization in scanning optical microscopy

Kathleen Youngworth, Thomas Brown

Proceedings Volume 3919, (2000) https://doi.org/10.1117/12.384181

KEYWORDS: Polarization, Confocal microscopy, Semiconductors, Microscopy, Microscopes, Optical microscopy, Image segmentation, Semiconductor lasers, Point spread functions, Gaussian beams

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Proceedings Article | 13 October 1999 Paper

Evidence of enhanced fluorescence via cross coupling in an integrated thin-film fluorescence sensor

Meg Tuma, Russell Gruhlke, Thomas Brown

Proceedings Volume 3783, (1999) https://doi.org/10.1117/12.365754

KEYWORDS: Sensors, Luminescence, Metals, Thin films, Photoresist materials, Silver, Dielectrics, Surface plasmons, Signal detection, Molecules

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Proceedings Article | 25 June 1999 Paper

Optical vernier interferometry for aspheric metrology

Paul Murphy, Thomas Brown, Duncan Moore

Proceedings Volume 3676, (1999) https://doi.org/10.1117/12.351139

KEYWORDS: Aspheric lenses, Interferometers, Wavefronts, Spherical lenses, Optics manufacturing, Mirrors, Interferometry, Beam splitters, Charge-coupled devices, Imaging systems

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Proceedings Article | 25 April 1997 Paper

Coupling, switching, and modulation in silicon-based optoelectronic structures

Thomas Brown, Amy Bieber

Proceedings Volume 3007, (1997) https://doi.org/10.1117/12.273847

KEYWORDS: Switching, Silicon, Waveguides, Electrodes, Switches, Modulation, Reflectivity, Optoelectronics, Modulators, Refractive index

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Proceedings Article | 10 April 1997 Paper

Solid state photon counters for scanned image acquisition: thermal and electronic saturation effects

Stephen Kreger, Thomas Brown

Proceedings Volume 2984, (1997) https://doi.org/10.1117/12.271270

KEYWORDS: Capacitance, Avalanche photodetectors, Solid state electronics, Photon counting, Diodes, Signal to noise ratio, Image acquisition, Time correlated photon counting, Sensors, Image quality

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Proceedings Article | 1 May 1996 Paper

Coupling and switching in optically resonant periodic electrode structures

Amy Bieber, Thomas Brown, Richard Tiberio

Proceedings Volume 2693, (1996) https://doi.org/10.1117/12.239017

KEYWORDS: Switching, Waveguides, Reflectivity, Silicon, Modulation, Phase shift keying, Optical switching, Fiber Bragg gratings, Reflectors, Electrodes

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Proceedings Article | 10 April 1996 Paper

Application of avalanche photodiodes to confocal and confocal florescence microscopy

Thomas Brown, Stephen Kreger

Proceedings Volume 2655, (1996) https://doi.org/10.1117/12.237495

KEYWORDS: Confocal microscopy, Photon counting, Sensors, Luminescence, Avalanche photodetectors, Avalanche photodiodes, Microscopy, Image acquisition, Solid state electronics, Diodes

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Showing 5 of 48 publications

Proceedings Volume Editor (17)

SPIE Conference Volume | 29 March 2024

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI

SPIE Conference Volume | 24 April 2023

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX

SPIE Conference Volume | 13 April 2022

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIX

SPIE Conference Volume | 9 April 2021

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVIII

SPIE Conference Volume | 13 March 2020

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII

Showing 5 of 17 publications

Conference Committee Involvement (39)

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXII

25 January 2025 | San Francisco, California, United States

Optical Modeling and Performance Predictions XIV

18 August 2024 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI

31 January 2024 | San Francisco, California, United States

Optical Modeling and Performance Predictions XIII

21 August 2023 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXX

1 February 2023 | San Francisco, California, United States

Optical Modeling and Performance Predictions XII

22 August 2022 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIX

26 January 2022 | San Francisco, California, United States

International Optical Design Conference 2021

27 June 2021 | Online Only, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVIII

6 March 2021 | Online Only, California, United States

Optical Modeling and Performance Predictions XI

24 August 2020 | Online Only, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII

4 February 2020 | San Francisco, California, United States

Optical Modeling and System Alignment

12 August 2019 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI

5 February 2019 | San Francisco, California, United States

Optical Modeling and Performance Predictions X

22 August 2018 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV

29 January 2018 | San Francisco, California, United States

Optical Modeling and Performance Predictions IX

8 August 2017 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV

30 January 2017 | San Francisco, California, United States

Optical Modeling and Performance Predictions VIII

1 September 2016 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII

15 February 2016 | San Francisco, California, United States

Optical Modeling and Performance Predictions VII

11 August 2015 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXII

10 February 2015 | San Francisco, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI

3 February 2014 | San Francisco, California, United States

Optical Modeling and Performance Predictions VI

29 August 2013 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX

5 February 2013 | San Francisco, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX

24 January 2012 | San Francisco, California, United States

Optical Modeling and Performance Predictions V

25 August 2011 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII

25 January 2011 | San Francisco, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII

26 January 2010 | San Francisco, California, United States

Optical Modeling and Performance Predictions IV

6 August 2009 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI

27 January 2009 | San Jose, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV

21 January 2008 | San Jose, California, United States

Optical Modeling and Performance Predictions III

29 August 2007 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIV

24 January 2007 | San Jose, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII

24 January 2006 | San Jose, California, United States

Optical Modeling and Performance Predictions II

3 August 2005 | San Diego, California, United States

Three-Dimensional and Multidimensional Microscopy: Image Processing and Acquisition XII

26 January 2005 | San Jose, CA, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI

28 January 2004 | San Jose, CA, United States

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X

28 January 2003 | San Jose, CA, United States

Education in Optics and Imaging Sciences

9 April 2001 | Rochester, NY, United States

Showing 5 of 39 Conference Committees

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