Mr. Tino Seliger Profile

Tino Seliger

at Helmholtz-Zentrum Berlin

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Publications (1)

Proceedings Article | 9 June 2023 Presentation

On the current state of reflective and diffractive X-ray optical elements and their characterization by means of ex-situ and at-wave-length metrology (Conference Presentation)

Frank Siewert, Jana Buchheim, Grzegorz Gwalt, Analia Fernandez Herrero, Stephanie Lemke, Svyatoslav Alimov, Jeniffa Knedel, Tino Seliger, Thomas Zeschke, Stefan Rehbein, Andrey Sokolov

Proceedings Volume PC12581, PC1258109 (2023) https://doi.org/10.1117/12.2666473

KEYWORDS: Optical components, Metrology, X-rays, X-ray optics, X-ray diffraction, X-ray characterization, Reflectivity, Manufacturing, Mirrors, Free electron lasers

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