Dr. Tzu-Ming Lu
at Sandia National Labs
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 9 June 2023 Presentation
Marek Osinski, Sami Nazib, Troy Hutchins-Delgado, Erika Sommer, Hosuk Lee, Loic Djamen Tchapda, Ruth Gyan-Darkwa, Erum Jamil, Thomas Rotter, Ganesh Balakrishnan, John Nogan, Tzu-Ming Lu, Ivan Komissarov, Roman Sobolewski
Proceedings Volume PC12570, PC1257003 (2023) https://doi.org/10.1117/12.2670470
KEYWORDS: Waveguides, Single photon detectors, Silicon, Quantum photonics, Integrated circuits, Fabrication, Design and modelling, Quantum entanglement, Quantum coherence, Active optics

Proceedings Article | 10 March 2023 Presentation + Paper
Loïc Djamen Tchapda, Anindya Bal, Sami Nazib, Troy Hutchins-Delgado, Hosuk Lee, Mark Reymatias, Erika Sommer, Ivan Komissarov, John Nogan, Tzu-Ming Lu, Roman Sobolewski, Marek Osiñski
Proceedings Volume 12415, 124150B (2023) https://doi.org/10.1117/12.2654772
KEYWORDS: Waveguides, Silicon, Modeling, Superconductors, Circuit switching, Quantum photonics, Single photon detectors, Inductance, Design and modelling, Integrated circuits

SPIE Journal Paper | 6 March 2021 Open Access
JM3, Vol. 20, Issue 01, 014901, (March 2021) https://doi.org/10.1117/12.10.1117/1.JMM.20.1.014901
KEYWORDS: Hydrogen, Silicon, Scanning tunneling microscopy, Optical lithography, Temperature metrology, Lithography, Pulsed laser operation, Semiconductor lasers, Manufacturing, Microelectronics

Proceedings Article | 23 March 2020 Presentation + Paper
A. Katzenmeyer, S. Dmitrovic, A. Baczewski, E. Bussmann, T.-M. Lu, E. Anderson, S. Schmucker, J. Ivie, D. Campbell, D. Ward, G. Wang, S. Misra
Proceedings Volume 11324, 113240Z (2020) https://doi.org/10.1117/12.2551455
KEYWORDS: Hydrogen, Silicon, Scanning tunneling microscopy, Pulsed laser operation, Optical lithography, Manufacturing, Lithography, Phosphorus, Absorption

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top