Mr. Xi Wang Profile

Xi Wang

at ZC Optoelectronic Technologies Ltd

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 9 October 2021 Paper

A multimodal method for defect characterization of large-aperture optics

Jian Chen, Weiyang Yu, Haifeng Zhou, Jian Zhang, Xi Wang, Wenyang Xu, Ming Huang

Proceedings Volume 11899, 118990D (2021) https://doi.org/10.1117/12.2603703

KEYWORDS: Laser scattering, Confocal microscopy, Scattering, Optics manufacturing, Microscopy, Laser induced damage, Defect inspection, Inspection, Absorption

Read Abstract +

It is very challenging to characterize surface/sub-surface defects for large-aperture optics. The first challenge is the conflict between high resolution and large field of view, namely how to reach a good balance between high resolution and high efficiency for detecting various defects with sub-micronover the meter-size surface of optics. The second challenge is how to classify defects accurately, which is very important for determining origin of defects and improving optics quality.In this paper, a multimodal inspection technique for surface/sub-surface defects of large-aperture optics is reported, in which a high speed laser scattering imaging with a sensitivity at 200-nm scale is used for defect discovery of large-aperture optics. The defect discovery provides a statistical result of defects of the optics. After that, a multifunctional microscopic method is used for local defect review. A photo thermal scanning microscopy is used for specific characterization of absorption defects, and a confocal microscopy is used for characterization of sub-surface defects. The defect review provides information for defect classification. Based on this multimodal technique, an inspection system is also developed and used for defect characterization of large optics.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years