Prof. Yasuhiro Awatsuji
Professor at Kyoto Institute of Technology
SPIE Involvement:
Conference Chair | Conference Program Committee | Editor | Author
Publications (62)

Proceedings Article | 20 September 2023 Paper
Ryuju Todo, Tomoyoshi Inoue, Sota Hashimoto, Shun Notte, Kenzo Nishio, Sudheesh Rajput, Osamu Matoba, Yasuhiro Awatsuji
Proceedings Volume 12608, 126080D (2023) https://doi.org/10.1117/12.3007508
KEYWORDS: Holograms, 3D image reconstruction, Phase shifts, Digital holography, Complex amplitude, Image quality, Image restoration, Digital imaging, Phase reconstruction, Biological imaging

Proceedings Article | 27 October 2021 Paper
Proceedings Volume 11925, 119250G (2021) https://doi.org/10.1117/12.2615657
KEYWORDS: Digital holography, Holography, Microscopes, Holograms, Blood, Spatial filters, Phase imaging, Optical components, Microscopy, Image sensors

Proceedings Article | 27 October 2021 Paper
Junya Inamoto, Shuhei Genko, Tomoyoshi Inoue, Kenzo Nishio, Osamu Matoba, Toshihiro Kubota, Yasuhiro Awatsuji
Proceedings Volume 11925, 119250H (2021) https://doi.org/10.1117/12.2615659
KEYWORDS: Digital holography, 3D image reconstruction, Microscopes, Holograms, Holography, Phase shifts, Digital imaging, Cameras, Optical sensors, Objectives

Proceedings Article | 27 October 2021 Paper
Sudheesh Rajput, Ryo Shinke, Xiangyu Quan, Yasuhiro Awatsuji, Osamu Matoba
Proceedings Volume 11925, 119250S (2021) https://doi.org/10.1117/12.2615674
KEYWORDS: Luminescence, Phase imaging, Imaging systems, Image sensors, Microscopy, Multimodal imaging, Image transmission, Digital holography, 3D image reconstruction, Objectives

Proceedings Article | 18 April 2021 Paper
Proceedings Volume 11774, 117740N (2021) https://doi.org/10.1117/12.2586311
KEYWORDS: Temperature metrology, Digital holography, Sensors, Refractive index, Phase measurement, Holographic interferometry, Combustion, Thermography, Resistance, Quality measurement

Showing 5 of 62 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 4 October 2023

SPIE Conference Volume | 27 October 2021

SPIE Conference Volume | 15 June 2020

SPIE Conference Volume | 15 June 2018

SPIE Conference Volume | 7 July 2017

Conference Committee Involvement (22)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Design and Testing XIV
12 October 2024 | Nantong, Jiangsu, China
Biomedical Imaging and Sensing Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Design and Testing XIII
14 October 2023 | Beijing, China
Showing 5 of 22 Conference Committees
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