CONFERENCE PROCEEDINGS
Advanced Search
Taerim Yoon
at Pusan National Univ
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 17 March 2023 Presentation
DMD-based optical inspection system using UV laser structured illumination for wide-range and high-resolution imaging
Proceedings Volume PC12363, PC123630U (2023) https://doi.org/10.1117/12.2648990
KEYWORDS: Imaging systems, Ultraviolet radiation, Optical inspection, Laser systems engineering, Scanning electron microscopy, Electron microscopes, Digital micromirror devices, Nanolithography, Microscopy, Image resolution
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top