Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Cihelka; L. Juha; J. Chalupský; F. B. Rosmej; O. Renner; K. Saksl; V. Hájková; L. Vyšin; E. Galtier; R. Schott; A. R. Khorsand; D. Riley; T. Dzelzainis; A. Nelson; R. W. Lee; P. Heimann; B. Nagler; S. Vinko; J. Wark; T. Whitcher; S. Toleikis; T. Tschentscher; R. Faustlin; H. Wabnitz; S. Bajt; H. Chapman; J. Krzywinski; R. Sobierajski; D. Klinger; M. Jurek; J. Pelka; S. Hau-Riege; R. A. London; J. Kuba; N. Stojanovic; K. Sokolowski-Tinten; A. J. Gleeson; M. Störmer; J. Andreasson; J. Hajdu; N. Timneanu

doi:10.1117/12.822766

18 May 2009 Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Cihelka, L. Juha, J. Chalupský, F. B. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. R. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. W. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. A. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. J. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu

Author Affiliations +

Proceedings Volume 7361, Damage to VUV, EUV, and X-Ray Optics II; 73610P (2009) https://doi.org/10.1117/12.822766
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

The beam of Free-Electron Laser in Hamburg (FLASH) tuned at either 32.5 nm or 13.7 nm was focused by a grazing incidence elliptical mirror and an off-axis parabolic mirror coated by Si/Mo multilayer on 20-micron and 1-micron spot, respectively. The grazing incidence and normal incidence focusing of ~10-fs pulses carrying an energy of 10 μJ lead at the surface of various solids (Si, Al, Ti, Ta, Si₃N₄, BN, a-C/Si, Ni/Si, Cr/Si, Rh/Si, Ce:YAG, poly(methyl methacrylate) - PMMA, stainless steel, etc.) to an irradiance of 10¹³ W/cm² and 10¹⁶ W/cm², respectively. The optical emission of the plasmas produced under these conditions was registered by grating (1200 lines/mm and/or 150 lines/mm) spectrometer MS257 (Oriel) equipped with iCCD head (iStar 720, Andor). Surprisingly, only lines belonging to the neutral atoms were observed at intensities around 10¹³ W/cm². No lines of atomic ions have been identified in UV-vis spectra emitted from the plasmas formed by the FLASH beam focused in a 20-micron spot. At intensities around 10¹⁶ W/cm², the OE spectra are again dominated by the atomic lines. However, a weak emission of Al⁺ and Al²⁺ was registered as well. The abundance ratio of Al/Al⁺ should be at least 100. The plasma is really cold, an excitation temperature equivalent to 0.8 eV was found by a computer simulation of the aluminum plasma OE spectrum. A broadband emission was also registered, both from the plasmas (typical is for carbon; there were no spectral lines) and the scintillators (on Ce:YAG crystal, both the luminescence bands and the line plasma emission were recorded by the spectrometer).

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J. Cihelka, L. Juha, J. Chalupský, F. B. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. R. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. W. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. A. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. J. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, and N. Timneanu "Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser", Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610P (18 May 2009); https://doi.org/10.1117/12.822766

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