Dr. Richard London
Associate Div. Leader at Lawrence Livermore National Lab
SPIE Involvement:
Author | Editor
Publications (54)

Proceedings Article | 9 September 2019 Presentation + Paper
Joseph Nilsen, D. Burridge, L.M. Hobbs, D. Hoarty, P. Beiersdorfer, G. Brown, N. Hell, D. Panchenko, M. Gu, A. Saunders, H. Scott, R. London, P. Hatfield, M. Hill, L. Wilson, R. Charles, C. R. Brown, S. Rose
Proceedings Volume 11111, 1111105 (2019) https://doi.org/10.1117/12.2528884
KEYWORDS: Chlorine, Germanium, Magnesium, Luminescence, Plasmas, Potassium, X-ray lasers, X-ray fluorescence spectroscopy, X-rays, Neon

Proceedings Article | 29 September 2009 Paper
Proceedings Volume 7451, 74510C (2009) https://doi.org/10.1117/12.825397
KEYWORDS: X-rays, X-ray lasers, Neon, Free electron lasers, Plasma, Femtosecond phenomena, Ions, X-ray optics, Chemical species, Temporal coherence

Proceedings Article | 18 May 2009 Paper
J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vysin, J. Gautier, J. Hajdu, S. Hau-Riege, M. Jurek, J. Krzywinski, Ri. London, E. Papalazarou, J. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, P. Zeitoun
Proceedings Volume 7361, 736108 (2009) https://doi.org/10.1117/12.822297
KEYWORDS: Polymethylmethacrylate, Laser ablation, X-rays, Solids, Atomic force microscopy, X-ray lasers, Chemical species, Signal attenuation, Gaussian beams, Surface roughness

Proceedings Article | 18 May 2009 Paper
R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hakova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. Hau-Reige, R. London
Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152
KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

Proceedings Article | 18 May 2009 Paper
J. Cihelka, L. Juha, J. Chalupský, F. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu
Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766
KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

Showing 5 of 54 publications
Proceedings Volume Editor (3)

Conference Committee Involvement (6)
Damage to VUV, EUV, and X-ray Optics V (XDam5)
15 April 2015 | Prague, Czech Republic
Damage to VUV, EUV, and X-ray Optics IV
15 April 2013 | Prague, Czech Republic
Damage to VUV, EUV, and X-ray Optics (XDam3)
18 April 2011 | Prague, Czech Republic
Damage to VUV, EUV, and X-ray Optics II (XDam2)
22 April 2009 | Prague, Czech Republic
Damage to VUV, EUV & X-ray Optics
18 April 2007 | Prague, Czech Republic
Showing 5 of 6 Conference Committees
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