Dr. Hubertus Wabnitz
at European XFEL GmbH
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 21 June 2017 Presentation
Vojtech Vozda, Pavel Boháček, Tomáš Burian, Jaromir Chalupský, Vera Hájková, Libor Juha, Ludek Vyšín, Jérôme Gaudin, Philip Heimann, Stefan Hau-Riege, Marek Jurek, Dorota Klinger, Jacek Krzywinski, Marc Messerschmidt, Stefan Moeller, Robert Nagler, Jerzy Pelka, Michael Rowen, William Schlotter, Michele Swiggers, Harald Sinn, Ryszard Sobierajski, Kai Tiedtke, Sven Toleikis, Thomas Tschentscher, Joshua Turner, Hubertus Wabnitz, Art Nelson, Maria Kozlova, Sam Vinko, Thomas Whitcher, Thomas Dzelzainis, Oldrich Renner, Karel Saksl, Roland Fäustlin, Ali Khorsand, Marta Fajardo, Bianca Iwan, Jakob Andreasson, Janos Hajdu, Nicusor Timneanu, Justin Wark, David Riley, Richard Lee, Mitsuru Nagasono, Makina Yabashi
Proceedings Volume 10236, 102360G (2017) https://doi.org/10.1117/12.2270944
KEYWORDS: Physics, Stanford Linear Collider, Free electron lasers, Lead, Photons, States of matter, Materials processing, Electrons, Analytical research, Raman spectroscopy

Proceedings Article | 19 May 2011 Paper
V. Hájková, L. Juha, P. Boháček, T. Burian, J. Chalupský, L. Vyšín, J. Gaudin, P. Heimann, S. Hau-Riege, M. Jurek, D. Klinger, J. Pelka, R. Sobierajski, J. Krzywinski, M. Messerschmidt, S. Moeller, B. Nagler, M. Rowen, W. Schlotter, M. Swiggers, J. Turner, S. Vinko, T. Whitcher, J. Wark, M. Matuchová, S. Bajt, H. Chapman, T. Dzelzainis, D. Riley, J. Andreasson, J. Hajdu, B. Iwan, N. Timneanu, K. Saksl, R. Fäustlin, A. Singer, K. Tiedtke, S. Toleikis, I. Vartaniants, H. Wabnitz
Proceedings Volume 8077, 807718 (2011) https://doi.org/10.1117/12.890134
KEYWORDS: X-rays, Liquid crystal lasers, Laser ablation, Lead, Free electron lasers, Signal attenuation, Extreme ultraviolet, X-ray lasers, Laser damage threshold, Polymethylmethacrylate

Proceedings Article | 18 May 2009 Paper
E. Louis, A. Khorsand, R. Sobierajski, E. van Hattum, M. Jurek, D. Klinger, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, U. Jastrow, S. Toleikis, H. Wabnitz, K. Tiedtke, J. Gaudin, E. Gullikson, F. Bijkerk
Proceedings Volume 7361, 73610I (2009) https://doi.org/10.1117/12.822257
KEYWORDS: Extreme ultraviolet, Multilayers, Reflectivity, Free electron lasers, Laser damage threshold, Atomic force microscopy, X-ray optics, Transmission electron microscopy, Optical coatings, Optical microscopy

Proceedings Article | 18 May 2009 Paper
Proceedings Volume 7361, 736110 (2009) https://doi.org/10.1117/12.822950
KEYWORDS: Laser damage threshold, Polymethylmethacrylate, Silicon carbide, Mirrors, Free electron lasers, Digital image correlation, Atomic force microscopy, Zinc, Laser ablation, Coating

Proceedings Article | 18 May 2009 Paper
R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hakova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. Hau-Reige, R. London
Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152
KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

Showing 5 of 10 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 3 May 2007

Conference Committee Involvement (1)
Damage to VUV, EUV & X-ray Optics
18 April 2007 | Prague, Czech Republic
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