Dan Wack has a PhD in Applied Physics from Cornell University, and a BA in Physics from Amherst College.

Currently, Dan is Senior Director of Advanced Technology in the Reticle Inspection Division at KLA-Tencor, and since 2008 has been Program Manager for the development of actinic EUV mask inspection systems. Dan has held multiple engineering leadership positions in new product development since joining Tencor in 1995, contributed technical assessments in M&A engagements, and contributed inventions leading to over 30 US patents.

Prior to joining Tencor, Dan was an Engineering Manager and Research Scientist at ADAC Labs and GE Medical Systems, developing PET scanners and gamma cameras for diagnostic radiology in nuclear medicine.

Dan held computational physics and systems engineering positions in GE Aerospace and the Institute for Defense Analyses, focused on long-range atmospheric transmission in estimating performance limits of tactical and strategic IR sensor systems.

At Cornell, Dan pursued thesis research in Watt Webb's group using synchrotron radiation diffraction analysis of structural and statistical properties of lyotropic smectic liquid crystal phases formed by lecithin.